Advanced Method for Predicting Lifetime of NAND Memory Data Retention Using Long term (1 Year) Characterization

In the actual storage situation of NAND solution products, the power managing and periodic read operations occur before data storage. Since these operations cause various situation of initial fail bits, it was considered to include these operations in the low temperature data retention (LTDR) evalua...

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Bibliographic Details
Main Authors: Lee, Ji Seok, Kim, Namyong, Kim, Shinhyung, Park, Il Han, Song, Hwangju, Lee, Kul, Cho, Young-Hoon, Hwang, Sangwon, Ko, Seungbum, Pae, Sangwoo
Format: Conference Proceeding
Language:English
Subjects:
Character recognition
Conferences
Data Retention
Flash memories
Industries
JEDEC
Lifespan
LTDR
NAND
Power-law Relationship
Prediction
Reliability
Temperature distribution
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Summary:In the actual storage situation of NAND solution products, the power managing and periodic read operations occur before data storage. Since these operations cause various situation of initial fail bits, it was considered to include these operations in the low temperature data retention (LTDR) evaluation to provide accurate lifetime prediction. An extrapolate method using the power-law relationship is used to predict LTDR lifetime. To increase the accuracy of this method, a calculation method for classifying the characteristics of the initial fail bit of NAND has been proposed.
ISSN:2374-8036
DOI:10.1109/IIRW59383.2023.10477637