Soft Error Tolerant Bandgap Reference Utilizing Single-Event Transient Filtering Technique

Bandgap is a critical block for numerous electronic systems, which provides stable voltage reference for multiple sub-modules over process, voltage supply, and temperature (PVT) fluctuations. This paper firstly proposes a radiation-hardened-by-design (RHBD) technique which can automatically detect s...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2024-04, Vol.71 (4), p.1-1
Main Authors: Liu, Jingtian, Wang, Dongsheng, Liang, Bin, Chi, Yaqing, Luo, Deng, Xu, Shi
Format: Article
Language:English
Subjects:
Bandgap reference
Electric potential
Electronic systems
Energy gap
Perturbation methods
Photonic band gap
Pulse amplitude
Radiation hardening
radiation-hardened-by-design (RHBD)
Resistors
single-event transient (SET)
Soft errors
Switches
Threshold voltage
Transient analysis
Transistors
Voltage
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Summary:Bandgap is a critical block for numerous electronic systems, which provides stable voltage reference for multiple sub-modules over process, voltage supply, and temperature (PVT) fluctuations. This paper firstly proposes a radiation-hardened-by-design (RHBD) technique which can automatically detect single-event transient (SET) disturbances and convert them into nanosecond-scale alternating signals, which can then be easily filtered by an on-chip filter. Theoretically, this technique can reduce SET amplitude to a negligible level regardless of bandgap structure and the output DC voltage. Laser experiments indicate that the SET pulse amplitude can be reduced from 896 mV to 48 mV under 800 pJ laser strike. This technique provides new guidance for SET mitigation on constant DC voltage and is widely applicable for bandgap radiation-hardening design.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2024.3381932