Noise in integrated-circuit transistors

Recent noise measurement from 1 Hz to 5 kHz on integrated-circuit transistors have shown an anomalous burst noise in addition to the usual noise spectrum. The terminal characteristics of the burst noise are presented and a phenomenological noise-circuit model is developed.

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Bibliographic Details
Published in:IEEE journal of solid-state circuits 1970-04, Vol.5 (2), p.63-66
Main Authors: Brodersen, A.J., Chenette, E.R., Jaeger, R.C.
Format: Article
Language:English
Subjects:
Circuit noise
Electrical resistance measurement
Electron tubes
Integrated circuit measurements
Integrated circuit noise
Laboratories
Noise generators
Noise measurement
Pulse measurements
Transistors
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Description
Summary:Recent noise measurement from 1 Hz to 5 kHz on integrated-circuit transistors have shown an anomalous burst noise in addition to the usual noise spectrum. The terminal characteristics of the burst noise are presented and a phenomenological noise-circuit model is developed.
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.1970.1050072