Characterization and design of sequentially t-diagnosable systems

In the system-level diagnosis area, F.P. Preparata, G. Metze, and R.T. Chien (1967) first presented a formal graph-theoretic model and introduced the concept of sequentially t-diagnosable systems. A system S is called sequentially t-diagnosable if, given any complete collection of test results, at l...

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Main Authors: Huang, S., Xu, J., Chen, T.
Format: Conference Proceeding
Language:English
Subjects:
Fault diagnosis
Large-scale systems
Sequential analysis
Sequential diagnosis
System testing
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Chen, T.
description In the system-level diagnosis area, F.P. Preparata, G. Metze, and R.T. Chien (1967) first presented a formal graph-theoretic model and introduced the concept of sequentially t-diagnosable systems. A system S is called sequentially t-diagnosable if, given any complete collection of test results, at least one faulty unit in S can be identified, provided the number of faulty units does not exceed t. However, until very recently, developing a characterization theorem of sequentially t-diagnosable systems for the PMC model was still an important, open problem. The authors resolve this problem by presenting the first complete characterization. A canonical class of systems, D/sub 1,k/ systems, is discussed, and a valuable result on the sequential t-diagnosability is obtained.< >
doi_str_mv 10.1109/FTCS.1989.105635
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ispartof [1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers, 1989, p.554-559
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subjects Fault diagnosis
Large-scale systems
Sequential analysis
Sequential diagnosis
System testing
title Characterization and design of sequentially t-diagnosable systems
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