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Highly Accelerated Life Testing of Bi-Sb Thermocouples in Planar Multijunction Thermal Converters
This paper presents the lifetime evaluation of the bismuth (Bi) and antimony (Sb) thermocouples assisted by the copper heat shunt in a planar multijunction thermal converter (MJTC) via highly accelerated life testing (HALT). The temperature is selected as the accelerated stress variable. The electri...
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creator | Amagai, Yasutaka Okawa, Kenjiro Sakamoto, Norihiko Kaneko, Nobu-Hisa |
description | This paper presents the lifetime evaluation of the bismuth (Bi) and antimony (Sb) thermocouples assisted by the copper heat shunt in a planar multijunction thermal converter (MJTC) via highly accelerated life testing (HALT). The temperature is selected as the accelerated stress variable. The electrical resistance increment of the thermopile is chosen as the primary signal of failure during HALT. The mean time to failure (MTTF) of the MJTC is calculated at several elevated temperatures using a two-parameter Weibull model. The accumulative failure rate fits well with the Weibull model. The MTTF at rated condition was predicted using the Arrhenius equation. The analysis shows that the MTTF of the modified thermocouple design has a considerably longer lifetime than that of the original one. |
doi_str_mv | 10.1109/CPEM61406.2024.10646068 |
format | conference_proceeding |
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The temperature is selected as the accelerated stress variable. The electrical resistance increment of the thermopile is chosen as the primary signal of failure during HALT. The mean time to failure (MTTF) of the MJTC is calculated at several elevated temperatures using a two-parameter Weibull model. The accumulative failure rate fits well with the Weibull model. The MTTF at rated condition was predicted using the Arrhenius equation. The analysis shows that the MTTF of the modified thermocouple design has a considerably longer lifetime than that of the original one.</description><identifier>EISSN: 2160-0171</identifier><identifier>EISBN: 9798350361049</identifier><identifier>DOI: 10.1109/CPEM61406.2024.10646068</identifier><language>eng</language><publisher>IEEE</publisher><subject>AC voltage ; AC-DC difference ; Bismuth ; Heating systems ; Life estimation ; Life testing ; Resistance ; thermal converters ; Thermocouples ; Voltage measurement</subject><ispartof>2024 Conference on Precision Electromagnetic Measurements (CPEM), 2024, p.1-2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10646068$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,27906,54536,54913</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10646068$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Amagai, Yasutaka</creatorcontrib><creatorcontrib>Okawa, Kenjiro</creatorcontrib><creatorcontrib>Sakamoto, Norihiko</creatorcontrib><creatorcontrib>Kaneko, Nobu-Hisa</creatorcontrib><title>Highly Accelerated Life Testing of Bi-Sb Thermocouples in Planar Multijunction Thermal Converters</title><title>2024 Conference on Precision Electromagnetic Measurements (CPEM)</title><addtitle>CPEM</addtitle><description>This paper presents the lifetime evaluation of the bismuth (Bi) and antimony (Sb) thermocouples assisted by the copper heat shunt in a planar multijunction thermal converter (MJTC) via highly accelerated life testing (HALT). The temperature is selected as the accelerated stress variable. The electrical resistance increment of the thermopile is chosen as the primary signal of failure during HALT. The mean time to failure (MTTF) of the MJTC is calculated at several elevated temperatures using a two-parameter Weibull model. The accumulative failure rate fits well with the Weibull model. The MTTF at rated condition was predicted using the Arrhenius equation. The analysis shows that the MTTF of the modified thermocouple design has a considerably longer lifetime than that of the original one.</description><subject>AC voltage</subject><subject>AC-DC difference</subject><subject>Bismuth</subject><subject>Heating systems</subject><subject>Life estimation</subject><subject>Life testing</subject><subject>Resistance</subject><subject>thermal converters</subject><subject>Thermocouples</subject><subject>Voltage measurement</subject><issn>2160-0171</issn><isbn>9798350361049</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2024</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo1kF1LwzAYhaMgOOf-gWD-QOubj6bt5SzTCR0OrNcjTd9uGVk70lTYv7cwvTo3D4fnHEKeGcSMQf5SbFcbxSSomAOXMQMlFajshizyNM9EAkIxkPktmXGmIAKWsnvyMAxHmHAAMSN6bfcHd6FLY9Ch1wEbWtoWaYVDsN2e9i19tdFXTasD-lNv-vHscKC2o1unO-3pZnTBHsfOBNt3V0o7WvTdD_qAfngkd612Ay7-ck6-31ZVsY7Kz_ePYllGdtIOkVQ61wKSTMs0AdkiCt3WBpVp0qROeMOEFAwh5dMgkaVG8ybhWS1kzUzeGjEnT9dei4i7s7cn7S-7_0vELzENVqo</recordid><startdate>20240708</startdate><enddate>20240708</enddate><creator>Amagai, Yasutaka</creator><creator>Okawa, Kenjiro</creator><creator>Sakamoto, Norihiko</creator><creator>Kaneko, Nobu-Hisa</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>20240708</creationdate><title>Highly Accelerated Life Testing of Bi-Sb Thermocouples in Planar Multijunction Thermal Converters</title><author>Amagai, Yasutaka ; Okawa, Kenjiro ; Sakamoto, Norihiko ; Kaneko, Nobu-Hisa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i106t-46a9a3058a47504fee3afbce6cd75b52d13431e072049387ca2d528b34b1c9fc3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2024</creationdate><topic>AC voltage</topic><topic>AC-DC difference</topic><topic>Bismuth</topic><topic>Heating systems</topic><topic>Life estimation</topic><topic>Life testing</topic><topic>Resistance</topic><topic>thermal converters</topic><topic>Thermocouples</topic><topic>Voltage measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Amagai, Yasutaka</creatorcontrib><creatorcontrib>Okawa, Kenjiro</creatorcontrib><creatorcontrib>Sakamoto, Norihiko</creatorcontrib><creatorcontrib>Kaneko, Nobu-Hisa</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Amagai, Yasutaka</au><au>Okawa, Kenjiro</au><au>Sakamoto, Norihiko</au><au>Kaneko, Nobu-Hisa</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Highly Accelerated Life Testing of Bi-Sb Thermocouples in Planar Multijunction Thermal Converters</atitle><btitle>2024 Conference on Precision Electromagnetic Measurements (CPEM)</btitle><stitle>CPEM</stitle><date>2024-07-08</date><risdate>2024</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><eissn>2160-0171</eissn><eisbn>9798350361049</eisbn><abstract>This paper presents the lifetime evaluation of the bismuth (Bi) and antimony (Sb) thermocouples assisted by the copper heat shunt in a planar multijunction thermal converter (MJTC) via highly accelerated life testing (HALT). The temperature is selected as the accelerated stress variable. The electrical resistance increment of the thermopile is chosen as the primary signal of failure during HALT. The mean time to failure (MTTF) of the MJTC is calculated at several elevated temperatures using a two-parameter Weibull model. The accumulative failure rate fits well with the Weibull model. The MTTF at rated condition was predicted using the Arrhenius equation. The analysis shows that the MTTF of the modified thermocouple design has a considerably longer lifetime than that of the original one.</abstract><pub>IEEE</pub><doi>10.1109/CPEM61406.2024.10646068</doi><tpages>2</tpages></addata></record> |
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source | IEEE Xplore All Conference Series |
subjects | AC voltage AC-DC difference Bismuth Heating systems Life estimation Life testing Resistance thermal converters Thermocouples Voltage measurement |
title | Highly Accelerated Life Testing of Bi-Sb Thermocouples in Planar Multijunction Thermal Converters |
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