Significantly Enhanced Insulation Resistance Degradation of BaTiO3-Based MLCCs with High Temperature Stability via Defect Engineering

• Main Authors: Tan, Junhui, Cheng, Lixia, Wang, Pengfei, Huang, Rongxia, Fu, Zhenxiao, Cao, Xiuhua, Zhang, Lei, Yu, Shuhui, Sun, Rong
• Format: Conference Proceeding
• Language: English
• Subjects: Capacitance; defect chemistry; Degradation; high temperature coefficient of capacitance; Insulation; insulation resistance degradation; MLCCs; Powders; Resistance; Space charge; Temperature
• ISSN: 2836-9734
• DOI: 10.1109/ICEPT63120.2024.10668563

Base metal electrodes-multilayer ceramic capacitors (BME-MLCCs) are important equipment components enabling electronic devices to achieve excellent performance, muti-functionality and high integration, which are considered to be a fascinating device for a diverse range of electric applications. However, the service lifespan of MLCCs mainly depends on the insulation resistance (IR) degradation behavior. To solve this problem, the current-voltage (I-V), capacitor-voltage (C-V), thermally stimulated depolarization current (TSDC) characteristics and highly accelerated life test (HALT) of \text{BaTiO}_{3} based BME-MLCCs with superior temperature coefficient of capacitance (TCC) were investigated systematically. It is found that the IR degradation behavior is closely related to the accumulation and migration of oxygen vacancies and space charges. It can be observed from the I-V results that the Ohmic, Schottky type conduction occurs with the increase of dc field in all samples, while Poole-Frenkel effect was only observed in specific samples w ith the re laxati on of trapped space charges and poor reliability. This work explores the degradation mechanism of \text{BaTiO}_{3}\text{-MLCCs} insulation resistance and provides a feasible strategy to improve its reliability.