A Simulation Workflow for Predicting IC Stripline Radiated Emissions of Bond Wire-Based Systems

Light sources in optical sensor packages can cause high levels of electromagnetic interference due to their high current consumption and short switching times. The radiating structures are electrically short for the frequency range of interest for metrological verification according to the IEC 61967...

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Bibliographic Details
Main Authors: Kreindl, Dominik, Weiss, Bernhard, Stockreiter, Christian, Bauernfeind, Thomas, Kaltenbacher, Manfred
Format: Conference Proceeding
Language:English
Subjects:
Electromagnetic compatibility
Electromagnetic interference
Finite element analysis
finite element method
Hertzian dipole moment
IC stripline
IEC Standards
Integrated circuits
Light sources
Optical sensors
Optical switches
radiated emissions
Stripline
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Summary:Light sources in optical sensor packages can cause high levels of electromagnetic interference due to their high current consumption and short switching times. The radiating structures are electrically short for the frequency range of interest for metrological verification according to the IEC 61967-8 standard. This can be used to find an equivalent representation of the emission sources in terms of Hertzian dipole moments. This paper presents a purely analytical simulation workflow for predicting radiated emissions in IC stripline measurements by employing dipole moments. The procedure is evaluated against finite element simulations and measurement data. The results show promising correlations in the lower frequency range, but significant deviations are observed above 1.5 GHz. Further research is needed to identify the root cause of these deviations.
ISSN:2575-6893
DOI:10.1109/EMCCompo61192.2024.10742020