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A Simulation Workflow for Predicting IC Stripline Radiated Emissions of Bond Wire-Based Systems

Light sources in optical sensor packages can cause high levels of electromagnetic interference due to their high current consumption and short switching times. The radiating structures are electrically short for the frequency range of interest for metrological verification according to the IEC 61967...

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Main Authors:	Kreindl, Dominik, Weiss, Bernhard, Stockreiter, Christian, Bauernfeind, Thomas, Kaltenbacher, Manfred
Format:	Conference Proceeding
Language:	English
Subjects:	Electromagnetic compatibility Electromagnetic interference Finite element analysis finite element method Hertzian dipole moment IC stripline IEC Standards Integrated circuits Light sources Optical sensors Optical switches radiated emissions Stripline
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creator	Kreindl, Dominik Weiss, Bernhard Stockreiter, Christian Bauernfeind, Thomas Kaltenbacher, Manfred
description	Light sources in optical sensor packages can cause high levels of electromagnetic interference due to their high current consumption and short switching times. The radiating structures are electrically short for the frequency range of interest for metrological verification according to the IEC 61967-8 standard. This can be used to find an equivalent representation of the emission sources in terms of Hertzian dipole moments. This paper presents a purely analytical simulation workflow for predicting radiated emissions in IC stripline measurements by employing dipole moments. The procedure is evaluated against finite element simulations and measurement data. The results show promising correlations in the lower frequency range, but significant deviations are observed above 1.5 GHz. Further research is needed to identify the root cause of these deviations.
doi_str_mv	10.1109/EMCCompo61192.2024.10742020
format	conference_proceeding
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Further research is needed to identify the root cause of these deviations.</description><identifier>EISSN: 2575-6893</identifier><identifier>EISBN: 9798331504632</identifier><identifier>DOI: 10.1109/EMCCompo61192.2024.10742020</identifier><language>eng</language><publisher>IEEE</publisher><subject>Electromagnetic compatibility ; Electromagnetic interference ; Finite element analysis ; finite element method ; Hertzian dipole moment ; IC stripline ; IEC Standards ; Integrated circuits ; Light sources ; Optical sensors ; Optical switches ; radiated emissions ; Stripline</subject><ispartof>International Workshop on Electromagnetic Compatibility of Integrated Circuits (Online), 2024, p.69-73</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10742020$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,27925,54555,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10742020$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kreindl, Dominik</creatorcontrib><creatorcontrib>Weiss, Bernhard</creatorcontrib><creatorcontrib>Stockreiter, Christian</creatorcontrib><creatorcontrib>Bauernfeind, Thomas</creatorcontrib><creatorcontrib>Kaltenbacher, Manfred</creatorcontrib><title>A Simulation Workflow for Predicting IC Stripline Radiated Emissions of Bond Wire-Based Systems</title><title>International Workshop on Electromagnetic Compatibility of Integrated Circuits (Online)</title><addtitle>EMC Compo</addtitle><description>Light sources in optical sensor packages can cause high levels of electromagnetic interference due to their high current consumption and short switching times. 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The radiating structures are electrically short for the frequency range of interest for metrological verification according to the IEC 61967-8 standard. This can be used to find an equivalent representation of the emission sources in terms of Hertzian dipole moments. This paper presents a purely analytical simulation workflow for predicting radiated emissions in IC stripline measurements by employing dipole moments. The procedure is evaluated against finite element simulations and measurement data. The results show promising correlations in the lower frequency range, but significant deviations are observed above 1.5 GHz. Further research is needed to identify the root cause of these deviations.</abstract><pub>IEEE</pub><doi>10.1109/EMCCompo61192.2024.10742020</doi></addata></record>
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identifier	EISSN: 2575-6893
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source	IEEE Xplore All Conference Series
subjects	Electromagnetic compatibility Electromagnetic interference Finite element analysis finite element method Hertzian dipole moment IC stripline IEC Standards Integrated circuits Light sources Optical sensors Optical switches radiated emissions Stripline
title	A Simulation Workflow for Predicting IC Stripline Radiated Emissions of Bond Wire-Based Systems
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