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Analysis of bulk acoustic wave response in ZnO based structures using transmission-line method

Piezoelectric thin film ZnO and its ternary alloy MgZnO have broad applications in transducers, resonators, filters and sensors. In ZnO based multi-layer piezoelectric device structures, such as ZnO on r-Al/sub 2/O/sub 3/, multi-acoustic wave mode coupling between each layer in the multilayer struct...

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Bibliographic Details
Main Authors: Wittstruck, R.H., Tong, X., Emanetoglu, N.W., Wu, P., Chen, Y., Lu, Y., Ballato, A.
Format: Conference Proceeding
Language:English
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Summary:Piezoelectric thin film ZnO and its ternary alloy MgZnO have broad applications in transducers, resonators, filters and sensors. In ZnO based multi-layer piezoelectric device structures, such as ZnO on r-Al/sub 2/O/sub 3/, multi-acoustic wave mode coupling between each layer in the multilayer structure must be considered. In this paper, we use transmission line representation to analyze frequency response of a structure based on piezoelectric Mg/sub x/Zn/sub 1-x/O. The structure is Al/Mg/sub x/Zn/sub 1-x/O/n/sup ++/ ZnO/r-sapphire, where the Al and n/sup ++/ ZnO layers serve as top and bottom electrodes, respectively. Due to the crystalline orientation of the n/sup ++/ ZnO electrode and r-plane sapphire used in this work, there exist quasi shear and longitudinal wave modes in the device. The simulation results and measured device response show general agreement.
DOI:10.1109/FREQ.2002.1075852