Heavy ION and Laser-Induced Single-Event Effects Test Results for a Low-Dropout Regulator and Voltage Feedback Amplifiers

Heavy ion and single photon absorption laser testing results are reported for the investigation of destructive and transient single-event effects in three radiation-hard, commercial-off-the-shelf analog parts: one low-dropout regulator and two voltage feedback amplifiers.

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Bibliographic Details
Main Authors: Auden, E. C., George, J. S., Fairbanks, T. D., Turner, S. J.
Format: Conference Proceeding
Language:English
Subjects:
Absorption
Feedback amplifiers
Ions
Laser feedback
Radiation effects
Regulators
Shape
Testing
Transient analysis
Voltage control
Online Access:Request full text
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Description
Summary:Heavy ion and single photon absorption laser testing results are reported for the investigation of destructive and transient single-event effects in three radiation-hard, commercial-off-the-shelf analog parts: one low-dropout regulator and two voltage feedback amplifiers.
ISSN:2154-0535
DOI:10.1109/REDW61286.2024.10759170