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TID Response of Commercial-of-the-Shelf Operational Amplifiers

Total ionizing dose effects on various COTS operational amplifiers were studied using low dose rate 6- CO irradiation. Total dose tolerance to 30 krad is demonstrated.

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Main Authors:	Sun, B., Moody, R., Hiemstra, D.M., Yang, J., Cundar, A. Noguera, Chavez, J. Cardenas, Chen, L.
Format:	Conference Proceeding
Language:	English
Subjects:	60CO Conferences Operational amplifier Operational amplifiers Total ionizing dose
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container_end_page	3
container_issue
container_start_page	1
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creator	Sun, B. Moody, R. Hiemstra, D.M. Yang, J. Cundar, A. Noguera Chavez, J. Cardenas Chen, L.
description	Total ionizing dose effects on various COTS operational amplifiers were studied using low dose rate 6- CO irradiation. Total dose tolerance to 30 krad is demonstrated.
doi_str_mv	10.1109/REDW61286.2024.10759227
format	conference_proceeding
fullrecord	<record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_10759227</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>10759227</ieee_id><sourcerecordid>10759227</sourcerecordid><originalsourceid>FETCH-ieee_primary_107592273</originalsourceid><addsrcrecordid>eNqFjkEKwjAUBaMgWLQ3EMwFUn_SxrYbQdqKrgQVXJYgPxhJTUnceHsVdO3qwQwDj5A5h4RzKBeHpj4vuSiWiQCRJRxyWQqRD0hc5mWRSkgL8WZDEgkuMwYylWMSh3ADgE8mijwiq9OupgcMvbsHpE7TynUd-otRljnNHldkxytaTfc9evUw7q4sXXe9NdqgD1My0soGjL87IbNNc6q2zCBi23vTKf9sf9fSP_oFfD47sQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>TID Response of Commercial-of-the-Shelf Operational Amplifiers</title><source>IEEE Xplore All Conference Series</source><creator>Sun, B. ; Moody, R. ; Hiemstra, D.M. ; Yang, J. ; Cundar, A. Noguera ; Chavez, J. Cardenas ; Chen, L.</creator><creatorcontrib>Sun, B. ; Moody, R. ; Hiemstra, D.M. ; Yang, J. ; Cundar, A. Noguera ; Chavez, J. Cardenas ; Chen, L.</creatorcontrib><description>Total ionizing dose effects on various COTS operational amplifiers were studied using low dose rate 6- CO irradiation. Total dose tolerance to 30 krad is demonstrated.</description><identifier>EISSN: 2154-0535</identifier><identifier>EISBN: 9798350382075</identifier><identifier>DOI: 10.1109/REDW61286.2024.10759227</identifier><language>eng</language><publisher>IEEE</publisher><subject>60CO ; Conferences ; Operational amplifier ; Operational amplifiers ; Total ionizing dose</subject><ispartof>Workshop record (IEEE Radiation Effects Data Workshop), 2024, p.1-3</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10759227$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,27925,54555,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10759227$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Sun, B.</creatorcontrib><creatorcontrib>Moody, R.</creatorcontrib><creatorcontrib>Hiemstra, D.M.</creatorcontrib><creatorcontrib>Yang, J.</creatorcontrib><creatorcontrib>Cundar, A. Noguera</creatorcontrib><creatorcontrib>Chavez, J. Cardenas</creatorcontrib><creatorcontrib>Chen, L.</creatorcontrib><title>TID Response of Commercial-of-the-Shelf Operational Amplifiers</title><title>Workshop record (IEEE Radiation Effects Data Workshop)</title><addtitle>REDW</addtitle><description>Total ionizing dose effects on various COTS operational amplifiers were studied using low dose rate 6- CO irradiation. Total dose tolerance to 30 krad is demonstrated.</description><subject>60CO</subject><subject>Conferences</subject><subject>Operational amplifier</subject><subject>Operational amplifiers</subject><subject>Total ionizing dose</subject><issn>2154-0535</issn><isbn>9798350382075</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2024</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNqFjkEKwjAUBaMgWLQ3EMwFUn_SxrYbQdqKrgQVXJYgPxhJTUnceHsVdO3qwQwDj5A5h4RzKBeHpj4vuSiWiQCRJRxyWQqRD0hc5mWRSkgL8WZDEgkuMwYylWMSh3ADgE8mijwiq9OupgcMvbsHpE7TynUd-otRljnNHldkxytaTfc9evUw7q4sXXe9NdqgD1My0soGjL87IbNNc6q2zCBi23vTKf9sf9fSP_oFfD47sQ</recordid><startdate>20240722</startdate><enddate>20240722</enddate><creator>Sun, B.</creator><creator>Moody, R.</creator><creator>Hiemstra, D.M.</creator><creator>Yang, J.</creator><creator>Cundar, A. Noguera</creator><creator>Chavez, J. Cardenas</creator><creator>Chen, L.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>20240722</creationdate><title>TID Response of Commercial-of-the-Shelf Operational Amplifiers</title><author>Sun, B. ; Moody, R. ; Hiemstra, D.M. ; Yang, J. ; Cundar, A. Noguera ; Chavez, J. Cardenas ; Chen, L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_107592273</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2024</creationdate><topic>60CO</topic><topic>Conferences</topic><topic>Operational amplifier</topic><topic>Operational amplifiers</topic><topic>Total ionizing dose</topic><toplevel>online_resources</toplevel><creatorcontrib>Sun, B.</creatorcontrib><creatorcontrib>Moody, R.</creatorcontrib><creatorcontrib>Hiemstra, D.M.</creatorcontrib><creatorcontrib>Yang, J.</creatorcontrib><creatorcontrib>Cundar, A. Noguera</creatorcontrib><creatorcontrib>Chavez, J. Cardenas</creatorcontrib><creatorcontrib>Chen, L.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore (Online service)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sun, B.</au><au>Moody, R.</au><au>Hiemstra, D.M.</au><au>Yang, J.</au><au>Cundar, A. Noguera</au><au>Chavez, J. Cardenas</au><au>Chen, L.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>TID Response of Commercial-of-the-Shelf Operational Amplifiers</atitle><btitle>Workshop record (IEEE Radiation Effects Data Workshop)</btitle><stitle>REDW</stitle><date>2024-07-22</date><risdate>2024</risdate><spage>1</spage><epage>3</epage><pages>1-3</pages><eissn>2154-0535</eissn><eisbn>9798350382075</eisbn><abstract>Total ionizing dose effects on various COTS operational amplifiers were studied using low dose rate 6- CO irradiation. Total dose tolerance to 30 krad is demonstrated.</abstract><pub>IEEE</pub><doi>10.1109/REDW61286.2024.10759227</doi></addata></record>
fulltext	fulltext_linktorsrc
identifier	EISSN: 2154-0535
ispartof	Workshop record (IEEE Radiation Effects Data Workshop), 2024, p.1-3
issn	2154-0535
language	eng
recordid	cdi_ieee_primary_10759227
source	IEEE Xplore All Conference Series
subjects	60CO Conferences Operational amplifier Operational amplifiers Total ionizing dose
title	TID Response of Commercial-of-the-Shelf Operational Amplifiers
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T05%3A20%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=TID%20Response%20of%20Commercial-of-the-Shelf%20Operational%20Amplifiers&rft.btitle=Workshop%20record%20(IEEE%20Radiation%20Effects%20Data%20Workshop)&rft.au=Sun,%20B.&rft.date=2024-07-22&rft.spage=1&rft.epage=3&rft.pages=1-3&rft.eissn=2154-0535&rft_id=info:doi/10.1109/REDW61286.2024.10759227&rft.eisbn=9798350382075&rft_dat=%3Cieee_CHZPO%3E10759227%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-ieee_primary_107592273%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=10759227&rfr_iscdi=true