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An Efficient Linear Programming Model for Dual-arm Cluster Tools with Chamber Cleaning Operation
In semiconductor manufacturing, a cluster tool consists of loadlocks, several processing chambers and a robot for transporting wafers. During wafer fabrication, a chamber needs cleaning for removing residual gases and solid particles to reduce risk of contamination wafer surface. Chamber cleaning ma...
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creator | Wu, GuanZhong Pan, ChunRong Xiong, WenQing He, Lifa |
description | In semiconductor manufacturing, a cluster tool consists of loadlocks, several processing chambers and a robot for transporting wafers. During wafer fabrication, a chamber needs cleaning for removing residual gases and solid particles to reduce risk of contamination wafer surface. Chamber cleaning makes the scheduling problem of cluster tools more complicated, which leads to deadlock. The method based on virtual wafer can avoid such problem, but this method also reduces chamber utilization. Aiming to improve the throughput of cluster tools with chamber cleaning, this paper modifies robot sequences and adjusts the processing time of virtual wafer. Then, based on the time characteristics of the system, a linear programming model is established to achieve the optimal solution of scheduling. Finally, illustrative examples are given to verify the feasibility and effectiveness of the proposed method. Compared with the existing virtual wafer method, this method can effectively reduce the system cycle time and improve the production efficiency of dual-arm cluster tools with chamber cleaning. |
doi_str_mv | 10.1109/ICNSC62968.2024.10760243 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_10760243</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>10760243</ieee_id><sourcerecordid>10760243</sourcerecordid><originalsourceid>FETCH-ieee_primary_107602433</originalsourceid><addsrcrecordid>eNqFjttKAzEURVNBaNH5Ax_OD8yYSyeZeZRYUagXsO812jNtSi7lZIr491bQZ58W7MWGxRgI3gjB--sH-_Rqtex110gu543gRp-oJqzqTd-plivdSinO2EwaretO63bKqlL2nHMljJm3asbebhIshsF_eEwjLH1CR_BCeUsuRp-28Jg3GGDIBLdHF2pHEWw4lhEJVjmHAp9-3IHdufh-mmxAl35uzwckN_qcLtn54ELB6pcX7OpusbL3tUfE9YF8dPS1_otX_-hvYSlIRQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>An Efficient Linear Programming Model for Dual-arm Cluster Tools with Chamber Cleaning Operation</title><source>IEEE Xplore All Conference Series</source><creator>Wu, GuanZhong ; Pan, ChunRong ; Xiong, WenQing ; He, Lifa</creator><creatorcontrib>Wu, GuanZhong ; Pan, ChunRong ; Xiong, WenQing ; He, Lifa</creatorcontrib><description>In semiconductor manufacturing, a cluster tool consists of loadlocks, several processing chambers and a robot for transporting wafers. During wafer fabrication, a chamber needs cleaning for removing residual gases and solid particles to reduce risk of contamination wafer surface. Chamber cleaning makes the scheduling problem of cluster tools more complicated, which leads to deadlock. The method based on virtual wafer can avoid such problem, but this method also reduces chamber utilization. Aiming to improve the throughput of cluster tools with chamber cleaning, this paper modifies robot sequences and adjusts the processing time of virtual wafer. Then, based on the time characteristics of the system, a linear programming model is established to achieve the optimal solution of scheduling. Finally, illustrative examples are given to verify the feasibility and effectiveness of the proposed method. Compared with the existing virtual wafer method, this method can effectively reduce the system cycle time and improve the production efficiency of dual-arm cluster tools with chamber cleaning.</description><identifier>EISSN: 2766-8665</identifier><identifier>EISBN: 9798350365221</identifier><identifier>DOI: 10.1109/ICNSC62968.2024.10760243</identifier><language>eng</language><publisher>IEEE</publisher><subject>chamber cleaning ; Cleaning ; cluster tools ; Gases ; Job shop scheduling ; Linear programming ; Process control ; Robot sensing systems ; scheduling optimization ; Semiconductor device manufacture ; Semiconductor device modeling ; semiconductor manufacturing ; System recovery ; Throughput</subject><ispartof>IEEE International Conference on Networking, Sensing and Control (Online), 2024, p.1-6</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10760243$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,27902,54530,54907</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10760243$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Wu, GuanZhong</creatorcontrib><creatorcontrib>Pan, ChunRong</creatorcontrib><creatorcontrib>Xiong, WenQing</creatorcontrib><creatorcontrib>He, Lifa</creatorcontrib><title>An Efficient Linear Programming Model for Dual-arm Cluster Tools with Chamber Cleaning Operation</title><title>IEEE International Conference on Networking, Sensing and Control (Online)</title><addtitle>ICNSC</addtitle><description>In semiconductor manufacturing, a cluster tool consists of loadlocks, several processing chambers and a robot for transporting wafers. During wafer fabrication, a chamber needs cleaning for removing residual gases and solid particles to reduce risk of contamination wafer surface. Chamber cleaning makes the scheduling problem of cluster tools more complicated, which leads to deadlock. The method based on virtual wafer can avoid such problem, but this method also reduces chamber utilization. Aiming to improve the throughput of cluster tools with chamber cleaning, this paper modifies robot sequences and adjusts the processing time of virtual wafer. Then, based on the time characteristics of the system, a linear programming model is established to achieve the optimal solution of scheduling. Finally, illustrative examples are given to verify the feasibility and effectiveness of the proposed method. Compared with the existing virtual wafer method, this method can effectively reduce the system cycle time and improve the production efficiency of dual-arm cluster tools with chamber cleaning.</description><subject>chamber cleaning</subject><subject>Cleaning</subject><subject>cluster tools</subject><subject>Gases</subject><subject>Job shop scheduling</subject><subject>Linear programming</subject><subject>Process control</subject><subject>Robot sensing systems</subject><subject>scheduling optimization</subject><subject>Semiconductor device manufacture</subject><subject>Semiconductor device modeling</subject><subject>semiconductor manufacturing</subject><subject>System recovery</subject><subject>Throughput</subject><issn>2766-8665</issn><isbn>9798350365221</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2024</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNqFjttKAzEURVNBaNH5Ax_OD8yYSyeZeZRYUagXsO812jNtSi7lZIr491bQZ58W7MWGxRgI3gjB--sH-_Rqtex110gu543gRp-oJqzqTd-plivdSinO2EwaretO63bKqlL2nHMljJm3asbebhIshsF_eEwjLH1CR_BCeUsuRp-28Jg3GGDIBLdHF2pHEWw4lhEJVjmHAp9-3IHdufh-mmxAl35uzwckN_qcLtn54ELB6pcX7OpusbL3tUfE9YF8dPS1_otX_-hvYSlIRQ</recordid><startdate>20241018</startdate><enddate>20241018</enddate><creator>Wu, GuanZhong</creator><creator>Pan, ChunRong</creator><creator>Xiong, WenQing</creator><creator>He, Lifa</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>20241018</creationdate><title>An Efficient Linear Programming Model for Dual-arm Cluster Tools with Chamber Cleaning Operation</title><author>Wu, GuanZhong ; Pan, ChunRong ; Xiong, WenQing ; He, Lifa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_107602433</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2024</creationdate><topic>chamber cleaning</topic><topic>Cleaning</topic><topic>cluster tools</topic><topic>Gases</topic><topic>Job shop scheduling</topic><topic>Linear programming</topic><topic>Process control</topic><topic>Robot sensing systems</topic><topic>scheduling optimization</topic><topic>Semiconductor device manufacture</topic><topic>Semiconductor device modeling</topic><topic>semiconductor manufacturing</topic><topic>System recovery</topic><topic>Throughput</topic><toplevel>online_resources</toplevel><creatorcontrib>Wu, GuanZhong</creatorcontrib><creatorcontrib>Pan, ChunRong</creatorcontrib><creatorcontrib>Xiong, WenQing</creatorcontrib><creatorcontrib>He, Lifa</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wu, GuanZhong</au><au>Pan, ChunRong</au><au>Xiong, WenQing</au><au>He, Lifa</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>An Efficient Linear Programming Model for Dual-arm Cluster Tools with Chamber Cleaning Operation</atitle><btitle>IEEE International Conference on Networking, Sensing and Control (Online)</btitle><stitle>ICNSC</stitle><date>2024-10-18</date><risdate>2024</risdate><spage>1</spage><epage>6</epage><pages>1-6</pages><eissn>2766-8665</eissn><eisbn>9798350365221</eisbn><abstract>In semiconductor manufacturing, a cluster tool consists of loadlocks, several processing chambers and a robot for transporting wafers. During wafer fabrication, a chamber needs cleaning for removing residual gases and solid particles to reduce risk of contamination wafer surface. Chamber cleaning makes the scheduling problem of cluster tools more complicated, which leads to deadlock. The method based on virtual wafer can avoid such problem, but this method also reduces chamber utilization. Aiming to improve the throughput of cluster tools with chamber cleaning, this paper modifies robot sequences and adjusts the processing time of virtual wafer. Then, based on the time characteristics of the system, a linear programming model is established to achieve the optimal solution of scheduling. Finally, illustrative examples are given to verify the feasibility and effectiveness of the proposed method. Compared with the existing virtual wafer method, this method can effectively reduce the system cycle time and improve the production efficiency of dual-arm cluster tools with chamber cleaning.</abstract><pub>IEEE</pub><doi>10.1109/ICNSC62968.2024.10760243</doi></addata></record> |
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subjects | chamber cleaning Cleaning cluster tools Gases Job shop scheduling Linear programming Process control Robot sensing systems scheduling optimization Semiconductor device manufacture Semiconductor device modeling semiconductor manufacturing System recovery Throughput |
title | An Efficient Linear Programming Model for Dual-arm Cluster Tools with Chamber Cleaning Operation |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T06%3A33%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=An%20Efficient%20Linear%20Programming%20Model%20for%20Dual-arm%20Cluster%20Tools%20with%20Chamber%20Cleaning%20Operation&rft.btitle=IEEE%20International%20Conference%20on%20Networking,%20Sensing%20and%20Control%20(Online)&rft.au=Wu,%20GuanZhong&rft.date=2024-10-18&rft.spage=1&rft.epage=6&rft.pages=1-6&rft.eissn=2766-8665&rft_id=info:doi/10.1109/ICNSC62968.2024.10760243&rft.eisbn=9798350365221&rft_dat=%3Cieee_CHZPO%3E10760243%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-ieee_primary_107602433%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=10760243&rfr_iscdi=true |