Preparation and characterization of chemically derived (Pb,La)TiO/sub 3/ thin films

Ferroelectric lead lanthanum titanate (PLT) thin films with composition varying from pure PbTiO/sub 3/ to PLT 25/100 (0 to 25 mol.% La) were prepared by spin-casting 0.25M solutions containing metallo-organic precursors of Pb, La, and Ti. The dielectric and ferroelectric properties of the thin (410-...

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Bibliographic Details
Published in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 1991-11, Vol.38 (6), p.677-683
Main Authors: Schwartz, R.W., Tuttle, B.A., Doughty, D.H., Land, C.E., Goodnow, D.C., Hernandez, C.L., Zender, T.J., Martinez, S.L.
Format: Article
Language:English
Subjects:
Chemicals
Dielectric constant
Dielectric thin films
Ferroelectric films
Ferroelectric materials
Lanthanum
Lead
Polarization
Temperature dependence
Titanium compounds
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Summary:Ferroelectric lead lanthanum titanate (PLT) thin films with composition varying from pure PbTiO/sub 3/ to PLT 25/100 (0 to 25 mol.% La) were prepared by spin-casting 0.25M solutions containing metallo-organic precursors of Pb, La, and Ti. The dielectric and ferroelectric properties of the thin (410-nm) films were characterized. The dielectric constants of the films varied from approximately 80 to approximately 690 for La contents varying from 0 to 25 mol%, respectively. Dissipation factors varied from approximately 0.03 to approximately 0.09 over the same compositional range. The temperature dependence of the dielectric properties was also studied to determine the effects of La content on the Curie point (T/sub c/). As expected, T/sub c/ was found to decrease with increasing La concentration. Coercive field and remanent polarization also decreased with increased La concentration.< >
ISSN:0885-3010
1525-8955
DOI:10.1109/58.108869