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A MESFET Variable-Capacitance Model for GaAs Integrated Circuit Simulation
A simple MESFET capacitance model which has a clearly explained physical meaning for a wide bias voltage range has been developed for use in simulations of GaAs integrated circuits. In this model, gate-source, gate-drain capacitances are represented by analytical expressions which are classified int...
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Published in: | IEEE transactions on microwave theory and techniques 1982-05, Vol.30 (5), p.719-724 |
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container_title | IEEE transactions on microwave theory and techniques |
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creator | Takada, T. Yokoyama Kiyoyuki Ida, M. Sudo, T. |
description | A simple MESFET capacitance model which has a clearly explained physical meaning for a wide bias voltage range has been developed for use in simulations of GaAs integrated circuits. In this model, gate-source, gate-drain capacitances are represented by analytical expressions which are classified into three different regions for bias voltages: a before-pinch-off region including the neighborhood of the built-in voltage, an after-pinch-off region, a transition region. 2-dimensional analysis results support the validity of the analytically derived capacitance model. The model is applicable to MESFET's used in integrated circuits that have low donor-thickness product. |
doi_str_mv | 10.1109/TMTT.1982.1131127 |
format | article |
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In this model, gate-source, gate-drain capacitances are represented by analytical expressions which are classified into three different regions for bias voltages: a before-pinch-off region including the neighborhood of the built-in voltage, an after-pinch-off region, a transition region. 2-dimensional analysis results support the validity of the analytically derived capacitance model. 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In this model, gate-source, gate-drain capacitances are represented by analytical expressions which are classified into three different regions for bias voltages: a before-pinch-off region including the neighborhood of the built-in voltage, an after-pinch-off region, a transition region. 2-dimensional analysis results support the validity of the analytically derived capacitance model. The model is applicable to MESFET's used in integrated circuits that have low donor-thickness product.</description><subject>Capacitance</subject><subject>Equivalent circuits</subject><subject>FETs</subject><subject>Gallium arsenide</subject><subject>Integrated circuit modeling</subject><subject>Logic</subject><subject>MESFET circuits</subject><subject>MESFET integrated circuits</subject><subject>Space charge</subject><subject>Voltage</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1982</creationdate><recordtype>article</recordtype><recordid>eNpFkL1OwzAUhS0EEqXwAIjFL5Di68SxPUZRaYtaMTSwRrfJDTJKk8pxB96eRK3EdHR0foaPsWcQCwBhX4tdUSzAGjnaGEDqGzYDpXRkUy1u2UwIMJFNjLhnD8PwM9pECTNj7xnfLfdvy4J_oXd4aCnK8YSVC9hVxHd9TS1ves9XmA180wX69hio5rnz1dkFvnfHc4vB9d0ju2uwHejpqnP2Of7m62j7sdrk2TaqYmlDdJBISYOyBlSaEkSyaS3IxIkAwDghMlQpBFMraVQNqcYDSUNaaWshpXjO4PJb-X4YPDXlybsj-t8SRDnBKCcY5QSjvMIYNy-XjSOi__41_QODDlqS</recordid><startdate>198205</startdate><enddate>198205</enddate><creator>Takada, T.</creator><creator>Yokoyama</creator><creator>Kiyoyuki</creator><creator>Ida, M.</creator><creator>Sudo, T.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>198205</creationdate><title>A MESFET Variable-Capacitance Model for GaAs Integrated Circuit Simulation</title><author>Takada, T. ; Yokoyama ; Kiyoyuki ; Ida, M. ; Sudo, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c329t-b2ae4fa2d1a57e4aae96d0e834011a34ee8ec5a18d5285d167abe28e7579916e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1982</creationdate><topic>Capacitance</topic><topic>Equivalent circuits</topic><topic>FETs</topic><topic>Gallium arsenide</topic><topic>Integrated circuit modeling</topic><topic>Logic</topic><topic>MESFET circuits</topic><topic>MESFET integrated circuits</topic><topic>Space charge</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Takada, T.</creatorcontrib><creatorcontrib>Yokoyama</creatorcontrib><creatorcontrib>Kiyoyuki</creatorcontrib><creatorcontrib>Ida, M.</creatorcontrib><creatorcontrib>Sudo, T.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Takada, T.</au><au>Yokoyama</au><au>Kiyoyuki</au><au>Ida, M.</au><au>Sudo, T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A MESFET Variable-Capacitance Model for GaAs Integrated Circuit Simulation</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1982-05</date><risdate>1982</risdate><volume>30</volume><issue>5</issue><spage>719</spage><epage>724</epage><pages>719-724</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>A simple MESFET capacitance model which has a clearly explained physical meaning for a wide bias voltage range has been developed for use in simulations of GaAs integrated circuits. In this model, gate-source, gate-drain capacitances are represented by analytical expressions which are classified into three different regions for bias voltages: a before-pinch-off region including the neighborhood of the built-in voltage, an after-pinch-off region, a transition region. 2-dimensional analysis results support the validity of the analytically derived capacitance model. The model is applicable to MESFET's used in integrated circuits that have low donor-thickness product.</abstract><pub>IEEE</pub><doi>10.1109/TMTT.1982.1131127</doi><tpages>6</tpages></addata></record> |
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subjects | Capacitance Equivalent circuits FETs Gallium arsenide Integrated circuit modeling Logic MESFET circuits MESFET integrated circuits Space charge Voltage |
title | A MESFET Variable-Capacitance Model for GaAs Integrated Circuit Simulation |
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