Image restoration in the near-field optic and UHF microscopy

Significant enhancement of resolution in the scanning near-field optical microscopy (SNOM) and in the microwave subsurface imaging (MSI) is achieved by deconvolution of measured 2-D images using Tikhonov's method. This method makes it possible to obtain much better sharpness of images.

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Bibliographic Details
Main Authors: Gaikovich, N.V.K.P., Dryakhlushin, V.F., Nozdrin, Yu.N., Reznik, A.N., Vaks, V.L., Zhilin, A.V.
Format: Conference Proceeding
Language:eng ; rus
Subjects:
Computed tomography
Hidden Markov models
IEEE catalog
Image restoration
Optical microscopy
Organizing
Transfer functions
Online Access:Request full text
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Description
Summary:Significant enhancement of resolution in the scanning near-field optical microscopy (SNOM) and in the microwave subsurface imaging (MSI) is achieved by deconvolution of measured 2-D images using Tikhonov's method. This method makes it possible to obtain much better sharpness of images.
DOI:10.1109/CRMICO.2002.1137314