Weighted random test program generation for a per-pin tester

The authors present an overview of a comprehensive software system that serves as an automatic bridge between computer-aided-design- (CAD-) generated weighted random patterns (WRPs-) and a per-pin tester that incorporates dedicated hardware to support WRP testing. A test program generation system th...

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Bibliographic Details
Main Authors: Gartner, J., Driscoll, B., Forlenza, D., Forlenza, O., Koprowski, T., Lizambri, T., Olsen, R., Robertson, S., Ryan, P., Walter, A.
Format: Conference Proceeding
Language:English
Subjects:
Application specific integrated circuits
Automatic test pattern generation
Automatic testing
Bridge circuits
Circuit testing
Hardware
Software systems
Software testing
System testing
Test pattern generators
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Summary:The authors present an overview of a comprehensive software system that serves as an automatic bridge between computer-aided-design- (CAD-) generated weighted random patterns (WRPs-) and a per-pin tester that incorporates dedicated hardware to support WRP testing. A test program generation system that integrates a level-sensitive-scan-design (LSSD-) based design system with a per-pin tester containing WRP hardware has been architected. This system generates complete test programs and permits the direct release of hundreds of ASIC (application-specific integrated circuit) devices into manufacturing. The benefits of low test data volume, improved test coverage, and finer diagnostic resolution provided by the WRP methodology are realized. The capture of delay defects is aided by the availability of several timing edges on a per-pin basis.< >
DOI:10.1109/TEST.1990.114122