Dependability analysis: a new application for run-time reconfiguration

The probability of faults, and especially transient faults, occurring in the field is increasing with the evolutions of the CMOS technologies. It becomes therefore crucial to predict the potential consequences of such faults on the applications. Fault injection techniques based on the high level des...

Full description

Saved in:
Bibliographic Details
Main Authors: Leveugle, R., Antoni, L., Feher, B.
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit simulation
CMOS technology
Emulation
Field programmable gate arrays
Hardware
Information analysis
Prototypes
Runtime
Space technology
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The probability of faults, and especially transient faults, occurring in the field is increasing with the evolutions of the CMOS technologies. It becomes therefore crucial to predict the potential consequences of such faults on the applications. Fault injection techniques based on the high level descriptions of the circuits have been proposed for an early dependability analysis. In this paper, a new approach is proposed, based on emulation and run-time reconfiguration. Performance evaluations and practical experiments on a Virtex development board are reported.
ISSN:1530-2075
DOI:10.1109/IPDPS.2003.1213319