Lowering cost of test: parallel test or low-cost ATE?

Low cost ATE has often been promoted as the obvious solution to reduce the cost of test. Parallel test is another well-known approach, where multiple devices are tested on one tester (multi-site test) while multiple blocks within one device are tested concurrently. This paper shows quantitatively th...

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Bibliographic Details
Main Author: Rivoir
Format: Conference Proceeding
Language:English
Subjects:
Automatic test equipment
Integrated circuit testing
Online Access:Request full text
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Summary:Low cost ATE has often been promoted as the obvious solution to reduce the cost of test. Parallel test is another well-known approach, where multiple devices are tested on one tester (multi-site test) while multiple blocks within one device are tested concurrently. This paper shows quantitatively that parallel test reduces test cost more effectively than low-cost ATE, because it reduces all test cost contributors, not only the capital cost of ATE.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2003.1250837