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Coupled device, circuit and interconnect simulation
In this paper, we discuss several aspects that are related to coupling device, circuit and interconnect simulation software. Straightforward co-simulation is too time-consuming, and hence reduced order modelling must be used in order to summarize the behaviour of individual simulations into compact...
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creator | Schilders, W. Meuris, P. |
description | In this paper, we discuss several aspects that are related to coupling device, circuit and interconnect simulation software. Straightforward co-simulation is too time-consuming, and hence reduced order modelling must be used in order to summarize the behaviour of individual simulations into compact models. From a theoretical point of view, the problem is complicated by the fact that equations of different type are being coupled. Mathematical techniques are indispensable for guaranteeing acceptable simulation times. The European project CODESTAR aims at providing a framework in which the aforementioned coupled simulations can be performed. The examples given in this paper have been taken from that project. |
doi_str_mv | 10.1109/ESSDERC.2003.1256801 |
format | conference_proceeding |
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Straightforward co-simulation is too time-consuming, and hence reduced order modelling must be used in order to summarize the behaviour of individual simulations into compact models. From a theoretical point of view, the problem is complicated by the fact that equations of different type are being coupled. Mathematical techniques are indispensable for guaranteeing acceptable simulation times. The European project CODESTAR aims at providing a framework in which the aforementioned coupled simulations can be performed. 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Straightforward co-simulation is too time-consuming, and hence reduced order modelling must be used in order to summarize the behaviour of individual simulations into compact models. From a theoretical point of view, the problem is complicated by the fact that equations of different type are being coupled. Mathematical techniques are indispensable for guaranteeing acceptable simulation times. The European project CODESTAR aims at providing a framework in which the aforementioned coupled simulations can be performed. The examples given in this paper have been taken from that project.</description><subject>Circuit simulation</subject><subject>Coupling circuits</subject><subject>Electromagnetic coupling</subject><subject>Frequency</subject><subject>Integrated circuit interconnections</subject><subject>Performance analysis</subject><subject>Proximity effect</subject><subject>Semiconductor device noise</subject><subject>Solid modeling</subject><subject>Substrates</subject><isbn>0780379993</isbn><isbn>9780780379992</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2003</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj8tKxDAUQAMiqON8gS76Abbm5jZNs5RaHzAgOLoe7iQ3EOmkQ5sK_r2CczZnd-AIcQuyApD2vt9uH_v3rlJSYgVKN62EM3ElTSvRWGvxQqzn-Uv-UWu0pr0U2I3LcWBfeP6Oju8KFye3xFxQ8kVMmSc3psQuF3M8LAPlOKZrcR5omHl98kp8PvUf3Uu5eXt-7R42ZVQKclmrxu-DC8TsrUQyRC4EZ1QbvCIDlrAG5KBJY61Qa-f3lpoGgNB4o3Albv67kZl3xykeaPrZnb7wF_qTRMI</recordid><startdate>2003</startdate><enddate>2003</enddate><creator>Schilders, W.</creator><creator>Meuris, P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2003</creationdate><title>Coupled device, circuit and interconnect simulation</title><author>Schilders, W. ; Meuris, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i221t-426dbfcfaeed903a7aacffc728fd2a719a3413ef5a5342355cdb9a6611a37d723</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Circuit simulation</topic><topic>Coupling circuits</topic><topic>Electromagnetic coupling</topic><topic>Frequency</topic><topic>Integrated circuit interconnections</topic><topic>Performance analysis</topic><topic>Proximity effect</topic><topic>Semiconductor device noise</topic><topic>Solid modeling</topic><topic>Substrates</topic><toplevel>online_resources</toplevel><creatorcontrib>Schilders, W.</creatorcontrib><creatorcontrib>Meuris, P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schilders, W.</au><au>Meuris, P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Coupled device, circuit and interconnect simulation</atitle><btitle>ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003</btitle><stitle>ESSDERC</stitle><date>2003</date><risdate>2003</risdate><spage>17</spage><epage>20</epage><pages>17-20</pages><isbn>0780379993</isbn><isbn>9780780379992</isbn><abstract>In this paper, we discuss several aspects that are related to coupling device, circuit and interconnect simulation software. Straightforward co-simulation is too time-consuming, and hence reduced order modelling must be used in order to summarize the behaviour of individual simulations into compact models. From a theoretical point of view, the problem is complicated by the fact that equations of different type are being coupled. Mathematical techniques are indispensable for guaranteeing acceptable simulation times. The European project CODESTAR aims at providing a framework in which the aforementioned coupled simulations can be performed. The examples given in this paper have been taken from that project.</abstract><pub>IEEE</pub><doi>10.1109/ESSDERC.2003.1256801</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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identifier | ISBN: 0780379993 |
ispartof | ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003, 2003, p.17-20 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuit simulation Coupling circuits Electromagnetic coupling Frequency Integrated circuit interconnections Performance analysis Proximity effect Semiconductor device noise Solid modeling Substrates |
title | Coupled device, circuit and interconnect simulation |
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