Monte Carlo Simulation of the Photoelectron Crosstalk in Silicon Imaging Devices

The Monte Carlo method is used to evaluate the extent of the crosstalk in solid-state imagers. The calculations are performed in three dimensions and are in excellent agreement with experiment. The Monte Carlo method is used because it handles adjacent regions that either collect or reflect minority...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 1985-10, Vol.4 (4), p.531-535
Main Authors: Lavine, J.P., Win-Chyi Chang, Anagnostopoulos, C.N., Burkey, B.C., Nelson, E.T.
Format: Article
Language:English
Subjects:
Alpha particles
Bipolar transistors
Boundary conditions
Crosstalk
Monte Carlo methods
Optical imaging
Semiconductor memory
Silicon
Solid state circuits
Testing
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Summary:The Monte Carlo method is used to evaluate the extent of the crosstalk in solid-state imagers. The calculations are performed in three dimensions and are in excellent agreement with experiment. The Monte Carlo method is used because it handles adjacent regions that either collect or reflect minority carriers.
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.1985.1270153