Optical and electrical testing of latchup in I/O interface circuits

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Bibliographic Details
Main Authors: Stellari, F., Peilin Song, McManus, M.K., Gauthier, R., Weger, A.J., Chatty, K., Muhammad, M., Sanda, P.
Format: Conference Proceeding
Language:English
Subjects:
Bipolar transistors
Circuit testing
CMOS technology
Current supplies
Electrostatic discharge
Ignition
Pins
Robustness
Thyristors
Voltage
Online Access:Request full text
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ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2003.1270845