A built-in self-repair scheme for semiconductor memories with 2-d redundancy

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Bibliographic Details
Main Authors: Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu
Format: Conference Proceeding
Language:English
Subjects:
Algorithm design and analysis
Automatic testing
Built-in self-test
Circuit testing
Random access memory
Read-write memory
Redundancy
Semiconductor device manufacture
Semiconductor device testing
System-on-a-chip
Online Access:Request full text
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ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2003.1270863