Instruction based bist for board/system level test of external memories and internconnects

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Bibliographic Details
Main Authors: Caty, O., Bayraktaroglu, I., Majumdar, A., Lee, R., Bell, J., Curhan, L.
Format: Conference Proceeding
Language:English
Subjects:
Access protocols
Built-in self-test
Costs
Engines
Logic testing
Manufacturing processes
Operating systems
Pipeline processing
Sun
System testing
Online Access:Request full text
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ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2003.1271083