Overview of the IEEE P1500 standard

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Bibliographic Details
Main Authors: DaSilva, F., Zorian, Y., Whetsel, L., Arabi, K., Kapur, R.
Format: Conference Proceeding
Language:English
Subjects:
Automatic testing
Design methodology
Design optimization
Hardware
IEEE standards
Instruments
Logic
Productivity
Registers
Online Access:Request full text
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Description
Summary:
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2003.1271086