Defect coverage of boundary-scan tests: what does it mean when a boundary-scan testpasses?

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Bibliographic Details
Main Author: Parker, K.P.
Format: Conference Proceeding
Language:English
Subjects:
Bills of materials
Connectors
Inductors
Integrated circuit testing
Mechanical factors
Pins
Polarization
Resistors
Soldering
System testing
Online Access:Request full text
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Description
Summary:
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2003.1271116