Adapting JTAG for AC interconnect testing

The use of AC coupled interconnects to provide communication paths between devices are increasing. The existing IEEE 1149.1 boundary scan standard (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the...

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Bibliographic Details
Main Author: Whetsel, L.
Format: Conference Proceeding
Language:English
Subjects:
Capacitors
Circuit testing
Instruments
Integrated circuit interconnections
Intelligent networks
Logic testing
Registers
Resistors
Timing
Voltage
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Description
Summary:The use of AC coupled interconnects to provide communication paths between devices are increasing. The existing IEEE 1149.1 boundary scan standard (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the JTAG architecture enabling it to operate in new modes facilitating AC interconnect testing.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2003.1271199