Reliability of oxide confined 850 nm VCSELs for high speed interconnection systems

The reliability of oxide confined 850 nm VCSELs for 10 Gb/s operation was investigated. The median life with criteria of 2 dB decrease of output power at environmental temperature of 25/spl deg/C was over 10 million hours.

Saved in:
Bibliographic Details
Main Authors: Sato, T., Iwai, N., Haga, Y., Ariga, M., Hama, T., Shimizu, H., Kasukawa, A.
Format: Conference Proceeding
Language:English
Subjects:
Accelerated aging
Costs
Life estimation
Local area networks
Power generation
Surface emitting lasers
Temperature
Testing
Threshold voltage
Vertical cavity surface emitting lasers
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The reliability of oxide confined 850 nm VCSELs for 10 Gb/s operation was investigated. The median life with criteria of 2 dB decrease of output power at environmental temperature of 25/spl deg/C was over 10 million hours.
DOI:10.1109/CLEOPR.2003.1274624