Improving BiCMOS technologies using BJT parametric mismatch characterisation

Why and how can parametric mismatch studies help to improve IC-technologies? After an introduction on the importance of parametric mismatch for performance and yield of mixed-signal as well as digital technologies, the basic terminology and techniques for BJT mismatch fluctuation assessment are revi...

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Bibliographic Details
Main Author: Tuinhout
Format: Conference Proceeding
Language:English
Subjects:
BiCMOS integrated circuits
Bipolar transistors
Circuit optimization
Yield estimation
Online Access:Request full text
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Summary:Why and how can parametric mismatch studies help to improve IC-technologies? After an introduction on the importance of parametric mismatch for performance and yield of mixed-signal as well as digital technologies, the basic terminology and techniques for BJT mismatch fluctuation assessment are reviewed. Two examples are discussed to demonstrate how parametric mismatch fluctuation studies help to improve better device architecture of poly-emitter BJTs. The ensuing process refinements result in better circuit functionality as well as yield improvements.
ISSN:1088-9299
2378-590X
DOI:10.1109/BIPOL.2003.1274959