Stress-induced frequency shifts in langasite thickness-mode resonators

In this paper, we report on our study of stress-induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly-rotated, specified by angles /spl phi/ and /spl theta/. The stresses are assumed to be uniform and planar. The first-order perturbation integral as develope...

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Bibliographic Details
Main Authors: Kosinski, J.A., Pastore, R.A., Yang, X., Yang, J., Turner, J.A.
Format: Conference Proceeding
Language:English
Subjects:
Anisotropic magnetoresistance
Elasticity
Electrodes
Piezoelectric devices
Resonant frequency
Stress
Surface acoustic waves
Vibrations
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Summary:In this paper, we report on our study of stress-induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly-rotated, specified by angles /spl phi/ and /spl theta/. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on /spl phi/ and /spl theta/ is calculated and examined, and loci of stress-compensation are determined. The analysis makes use of the third-order material constants that are available for langasite but not for its isomorphs.
ISSN:1075-6787
DOI:10.1109/FREQ.2003.1275181