An intelligent interface node for use in computer-integrated manufacturing (CIM)

• Main Author: Pardue, M.D.
• Format: Conference Proceeding
• Language: English
• Subjects: Application software; Computational modeling; Computer integrated manufacturing; Computer simulation; Data communication; Diagnostic expert systems; Distributed information systems; Protocols; Spine; Uncertainty
• DOI: 10.1109/CIM.1990.128103

Design and simulation results are presented for an expert-system-based interface node appropriate for use in a CIM environment. The interface node is a major step toward resolving two of the primary problems present in CIM applications: inadequate communications resources for handling real-time data requirements including priority interrupts, and uncertainty of data concerning conditions in the manufacturing cell served by the node. A technique is presented to reorder the transmission of data through the intelligent interface nodes connected to the primary data-communications channel. A secondary communications channel is used for the transmission of the information necessary to implement the technique. A second technique is presented to diagnose, under conditions of uncertainty, major problems with operations in the manufacturing cell served by the intelligent interface node. This approach is based on the MYCIN model methodology for dealing with uncertainty and is specially modified for a CIM environment. The techniques were simulated for an example case study on an IBM-compatible personal computer. The results clearly demonstrate that this intelligent interface node works even for imperfect information.< >