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Complex optical low coherence reflectometry (OLCR) with tunable source
It is shown theoretically for the first time that the complex impulse response (IR) of a bandwidth-limited optical device can be measured by having a tunable source for an amplitude-sensitive optical low coherence reflectometry. Systematic errors in the measurement technique are quantified through n...
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Published in: | IEEE photonics technology letters 2004-05, Vol.16 (5), p.1346-1348 |
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container_title | IEEE photonics technology letters |
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creator | Engin, D. |
description | It is shown theoretically for the first time that the complex impulse response (IR) of a bandwidth-limited optical device can be measured by having a tunable source for an amplitude-sensitive optical low coherence reflectometry. Systematic errors in the measurement technique are quantified through numerical simulations for fiber gratings and arrayed waveguide gratings. The errors are expected to be as low as 1/spl deg/ for phase, 0.5% for amplitude of the IR. |
doi_str_mv | 10.1109/LPT.2004.826103 |
format | article |
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Systematic errors in the measurement technique are quantified through numerical simulations for fiber gratings and arrayed waveguide gratings. The errors are expected to be as low as 1/spl deg/ for phase, 0.5% for amplitude of the IR.</description><identifier>ISSN: 1041-1135</identifier><identifier>EISSN: 1941-0174</identifier><identifier>DOI: 10.1109/LPT.2004.826103</identifier><identifier>CODEN: IPTLEL</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Arrayed waveguide gratings ; Band theory ; Coherence ; Diffraction gratings ; Fiber gratings ; Gratings (spectra) ; Impulse response ; Infrared radiation ; Measurement techniques ; Numerical simulation ; Optical devices ; Optical fiber devices ; Optical waveguides ; Reflectometry ; Systematic errors ; Time measurement</subject><ispartof>IEEE photonics technology letters, 2004-05, Vol.16 (5), p.1346-1348</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The errors are expected to be as low as 1/spl deg/ for phase, 0.5% for amplitude of the IR.</description><subject>Arrayed waveguide gratings</subject><subject>Band theory</subject><subject>Coherence</subject><subject>Diffraction gratings</subject><subject>Fiber gratings</subject><subject>Gratings (spectra)</subject><subject>Impulse response</subject><subject>Infrared radiation</subject><subject>Measurement techniques</subject><subject>Numerical simulation</subject><subject>Optical devices</subject><subject>Optical fiber devices</subject><subject>Optical waveguides</subject><subject>Reflectometry</subject><subject>Systematic errors</subject><subject>Time measurement</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNp9kM9LwzAYhosoOKdnD16KB38cuuVL0jQ5SnEqDCYyzyGNX1lH19SmZe6_N2OC4MHT9x6e94P3iaJLIBMAoqbz1-WEEsInkgog7CgageKQEMj4ccgkZACWnkZn3q8JAZ4yPopmudu0NX7Fru0ra-q4dtvYuhV22FiMOyxrtL3bYN_t4rvFPH-7j7dVv4r7oTFFjbF3Q2fxPDopTe3x4ueOo_fZ4zJ_TuaLp5f8YZ5YxlWfiA9TGsp5wWnJs7JUlIPgkkCRFSAww5RIUiKTojDIwHBOjM0UFsiKgKZsHN0e_rad-xzQ93pTeYt1bRp0g9dSCcozmqpA3vxLUkkBpNiD13_AdZjUhBVaSpapTPA9ND1AtnPeByu67aqN6XYaiN7r10G_3uvXB_2hcXVoVIj4S1MFKRHsGxOxfyk</recordid><startdate>20040501</startdate><enddate>20040501</enddate><creator>Engin, D.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Systematic errors in the measurement technique are quantified through numerical simulations for fiber gratings and arrayed waveguide gratings. The errors are expected to be as low as 1/spl deg/ for phase, 0.5% for amplitude of the IR.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/LPT.2004.826103</doi><tpages>3</tpages></addata></record> |
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language | eng |
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source | IEEE Electronic Library (IEL) Journals |
subjects | Arrayed waveguide gratings Band theory Coherence Diffraction gratings Fiber gratings Gratings (spectra) Impulse response Infrared radiation Measurement techniques Numerical simulation Optical devices Optical fiber devices Optical waveguides Reflectometry Systematic errors Time measurement |
title | Complex optical low coherence reflectometry (OLCR) with tunable source |
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