Parallel test reduces cost of test more effectively than just a cheap tester

Today's manufacturers of high-volume consumer devices are under tremendous cost pressure and consequently under extreme pressure to reduce cost of test. Low-cost ATE has often been promoted as the obvious solution. Parallel test is another well-known approach, where multiple devices are tested...

Full description

Saved in:
Bibliographic Details
Main Author: Rivoir, J.
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Cost function
Electronics
Exact sciences and technology
Manufacturing
Power generation economics
Production
Research and development
Semiconductor device manufacture
Semiconductor device modeling
Sequential analysis
Testing
Testing, measurement, noise and reliability
Transistors
Citations: Items that cite this one
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Today's manufacturers of high-volume consumer devices are under tremendous cost pressure and consequently under extreme pressure to reduce cost of test. Low-cost ATE has often been promoted as the obvious solution. Parallel test is another well-known approach, where multiple devices are tested in parallel (multi-site test) and/or multiple blocks within one device are tested in parallel (concurrent test). This paper shows quantitatively that parallel test is a much effective test cost reduction method than low-cost ATE, because it reduces all test cost contributors, not only capital cost of ATE. It also shows that the optimum number of sites is relatively insensitive to ATE capital cost, operating cost, yield, and various limiting factors, but the cost benefits diminish fast, if limited independent ATE resources reduce the degree of parallelism and force a partially sequential test.
ISSN:1089-8190
2576-9626
DOI:10.1109/IEMT.2004.1321674