Ring generators - new devices for embedded test applications

This paper presents a novel methodology of designing generators and compactors of test data. The essence of the proposed approach is to use a set of transformations, which alters the structure of the conventional linear feedback shift registers (LFSRs) while preserving the transition function of the...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 2004-09, Vol.23 (9), p.1306-1320
Main Authors: Mrugalski, G., Rajski, J., Tyszer, J.
Format: Article
Language:English
Subjects:
Associate members
Automatic testing
Circuit testing
Circuits
Design methodology
Devices
Feedback
Feedback circuits
Flip-flops
Generators
Hardware
Linear feedback shift registers
Mathematical analysis
Mathematical models
Polynomials
Preserving
Test pattern generators
Transformations
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Summary:This paper presents a novel methodology of designing generators and compactors of test data. The essence of the proposed approach is to use a set of transformations, which alters the structure of the conventional linear feedback shift registers (LFSRs) while preserving the transition function of the original circuits. It is shown that after applying the transition function preserving transformations in a certain order, the resultant circuits feature a significantly reduced the number of levels of XOR logic, minimized internal fanouts, and simplified circuit layout and routing, as compared to previous schemes based on external feedback LFSRs, internal feedback LFSRs, and cellular automata, all implementing the same characteristic polynomial. Consequently, the proposed devices can operate at higher speeds than those of conventional solutions and become highly modular structures.
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2004.831584