A low cost time resolved spot diagnostic for flash X-ray machines

Summary form only given. AWE has embarked on a programme of work to develop an improved intense electron beam diode for flash X-ray radiography machines. In order to understand the performance of the diode, and to validate computer modeling codes, there is a requirement to obtain time resolved X-ray...

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Bibliographic Details
Main Authors: Aedy, C., Quillin, S., Critchley, A.D.J.
Format: Conference Proceeding
Language:English
Subjects:
Batteries
Cameras
Charge coupled devices
Charge-coupled image sensors
Costs
Diagnostic radiography
Diodes
Electron beams
EMP radiation effects
Optical control
Online Access:Request full text
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Description
Summary:Summary form only given. AWE has embarked on a programme of work to develop an improved intense electron beam diode for flash X-ray radiography machines. In order to understand the performance of the diode, and to validate computer modeling codes, there is a requirement to obtain time resolved X-ray spot size and position data during the 50 ns electron beam pulse. A simple, low cost, time resolved spot diagnostic is described, based around a number of single frame, fast gating intensified CCD camera modules focussed onto a very fast organic scintillator. Each camera is independently triggered and capable of gate widths down to 2 ns. The complete system is battery driven and controlled remotely via optical fibres to provide electrical isolation and reduce EMP susceptibility. An initial four frame system (easily extendable to 8 frames and beyond) has been developed. Evaluations of the optical and radiological response are described. Time resolved spot size measurements from a number of electron beam diodes fielded upon flash X-ray machines are also reported.
ISSN:0730-9244
2576-7208
DOI:10.1109/PLASMA.2004.1339939