Genetic algorithm based diode model prameters extraction

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Main Author: Almashary, B.
Format: Conference Proceeding
Language:English
Subjects:
Circuit simulation
Circuit synthesis
Circuit testing
Condition monitoring
Data mining
Genetic algorithms
Optimization methods
P-n junctions
Robustness
Schottky diodes
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doi_str_mv 10.1109/ICEEC.2004.1374526
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identifier ISBN: 0780385756
ispartof International Conference on Electrical, Electronic and Computer Engineering, 2004. ICEEC '04, 2004, p.545-548
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Circuit simulation
Circuit synthesis
Circuit testing
Condition monitoring
Data mining
Genetic algorithms
Optimization methods
P-n junctions
Robustness
Schottky diodes
title Genetic algorithm based diode model prameters extraction
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