Loading…

A method to rank heat sinks in practice: the heat sink performance tester

One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is ba...

Full description

Saved in:
Bibliographic Details
Main Authors: Lasance, C.J.M., Eggink, H.J.
Format: Conference Proceeding
Language:English
Subjects:
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 145
container_issue
container_start_page 141
container_title
container_volume
creator Lasance, C.J.M.
Eggink, H.J.
description One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application.
doi_str_mv 10.1109/STHERM.2005.1412170
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1412170</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1412170</ieee_id><sourcerecordid>1412170</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-5aad18792b4ccc2d6d120acdd749eeb82c0ce479f303d41755443ac7c3756043</originalsourceid><addsrcrecordid>eNpFkMtOwzAURC0eEqH0C7rxDyRcv2KHXVWVtlIREmRfufaNYkrSyPaGv6cSlVjNYs6cxRCyYFAxBs3zZ7tdf7xVHEBVTDLONNyQgiutSwYAt-QRtAFhGqOaO1IwqFXJOWcPZJ7S14UAqYQBXpDdkg6Y-7On-UyjHU-0R5tpCuMp0TDSKVqXg8MXmnv87-iEsTvHwY4OacaUMT6R-85-J5xfc0ba13W72pb7981utdyXgWmVS2WtZ0Y3_Cidc9zXnnGwznstG8Sj4Q4cSt10AoSXl4mSUlinndCqBilmZPGnDYh4mGIYbPw5XE8Qv_k1TkE</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A method to rank heat sinks in practice: the heat sink performance tester</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Lasance, C.J.M. ; Eggink, H.J.</creator><creatorcontrib>Lasance, C.J.M. ; Eggink, H.J.</creatorcontrib><description>One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application.</description><identifier>ISSN: 1065-2221</identifier><identifier>ISBN: 0780389859</identifier><identifier>ISBN: 9780780389854</identifier><identifier>EISSN: 2577-1000</identifier><identifier>DOI: 10.1109/STHERM.2005.1412170</identifier><language>eng</language><publisher>IEEE</publisher><subject>Computational fluid dynamics ; Costs ; Ducts ; Electronics cooling ; Heat sinks ; Heat transfer ; Joining processes ; Manufacturing ; Supercomputers ; Testing</subject><ispartof>Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005, 2005, p.141-145</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1412170$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1412170$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lasance, C.J.M.</creatorcontrib><creatorcontrib>Eggink, H.J.</creatorcontrib><title>A method to rank heat sinks in practice: the heat sink performance tester</title><title>Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005</title><addtitle>STHERM</addtitle><description>One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application.</description><subject>Computational fluid dynamics</subject><subject>Costs</subject><subject>Ducts</subject><subject>Electronics cooling</subject><subject>Heat sinks</subject><subject>Heat transfer</subject><subject>Joining processes</subject><subject>Manufacturing</subject><subject>Supercomputers</subject><subject>Testing</subject><issn>1065-2221</issn><issn>2577-1000</issn><isbn>0780389859</isbn><isbn>9780780389854</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFkMtOwzAURC0eEqH0C7rxDyRcv2KHXVWVtlIREmRfufaNYkrSyPaGv6cSlVjNYs6cxRCyYFAxBs3zZ7tdf7xVHEBVTDLONNyQgiutSwYAt-QRtAFhGqOaO1IwqFXJOWcPZJ7S14UAqYQBXpDdkg6Y-7On-UyjHU-0R5tpCuMp0TDSKVqXg8MXmnv87-iEsTvHwY4OacaUMT6R-85-J5xfc0ba13W72pb7981utdyXgWmVS2WtZ0Y3_Cidc9zXnnGwznstG8Sj4Q4cSt10AoSXl4mSUlinndCqBilmZPGnDYh4mGIYbPw5XE8Qv_k1TkE</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Lasance, C.J.M.</creator><creator>Eggink, H.J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2005</creationdate><title>A method to rank heat sinks in practice: the heat sink performance tester</title><author>Lasance, C.J.M. ; Eggink, H.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-5aad18792b4ccc2d6d120acdd749eeb82c0ce479f303d41755443ac7c3756043</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Computational fluid dynamics</topic><topic>Costs</topic><topic>Ducts</topic><topic>Electronics cooling</topic><topic>Heat sinks</topic><topic>Heat transfer</topic><topic>Joining processes</topic><topic>Manufacturing</topic><topic>Supercomputers</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Lasance, C.J.M.</creatorcontrib><creatorcontrib>Eggink, H.J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore (Online service)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lasance, C.J.M.</au><au>Eggink, H.J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A method to rank heat sinks in practice: the heat sink performance tester</atitle><btitle>Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005</btitle><stitle>STHERM</stitle><date>2005</date><risdate>2005</risdate><spage>141</spage><epage>145</epage><pages>141-145</pages><issn>1065-2221</issn><eissn>2577-1000</eissn><isbn>0780389859</isbn><isbn>9780780389854</isbn><abstract>One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application.</abstract><pub>IEEE</pub><doi>10.1109/STHERM.2005.1412170</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1065-2221
ispartof Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005, 2005, p.141-145
issn 1065-2221
2577-1000
language eng
recordid cdi_ieee_primary_1412170
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Computational fluid dynamics
Costs
Ducts
Electronics cooling
Heat sinks
Heat transfer
Joining processes
Manufacturing
Supercomputers
Testing
title A method to rank heat sinks in practice: the heat sink performance tester
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T21%3A31%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20method%20to%20rank%20heat%20sinks%20in%20practice:%20the%20heat%20sink%20performance%20tester&rft.btitle=Semiconductor%20Thermal%20Measurement%20and%20Management%20IEEE%20Twenty%20First%20Annual%20IEEE%20Symposium,%202005&rft.au=Lasance,%20C.J.M.&rft.date=2005&rft.spage=141&rft.epage=145&rft.pages=141-145&rft.issn=1065-2221&rft.eissn=2577-1000&rft.isbn=0780389859&rft.isbn_list=9780780389854&rft_id=info:doi/10.1109/STHERM.2005.1412170&rft_dat=%3Cieee_6IE%3E1412170%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-5aad18792b4ccc2d6d120acdd749eeb82c0ce479f303d41755443ac7c3756043%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1412170&rfr_iscdi=true