Loading…
A method to rank heat sinks in practice: the heat sink performance tester
One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is ba...
Saved in:
Main Authors: | , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 145 |
container_issue | |
container_start_page | 141 |
container_title | |
container_volume | |
creator | Lasance, C.J.M. Eggink, H.J. |
description | One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application. |
doi_str_mv | 10.1109/STHERM.2005.1412170 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1412170</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1412170</ieee_id><sourcerecordid>1412170</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-5aad18792b4ccc2d6d120acdd749eeb82c0ce479f303d41755443ac7c3756043</originalsourceid><addsrcrecordid>eNpFkMtOwzAURC0eEqH0C7rxDyRcv2KHXVWVtlIREmRfufaNYkrSyPaGv6cSlVjNYs6cxRCyYFAxBs3zZ7tdf7xVHEBVTDLONNyQgiutSwYAt-QRtAFhGqOaO1IwqFXJOWcPZJ7S14UAqYQBXpDdkg6Y-7On-UyjHU-0R5tpCuMp0TDSKVqXg8MXmnv87-iEsTvHwY4OacaUMT6R-85-J5xfc0ba13W72pb7981utdyXgWmVS2WtZ0Y3_Cidc9zXnnGwznstG8Sj4Q4cSt10AoSXl4mSUlinndCqBilmZPGnDYh4mGIYbPw5XE8Qv_k1TkE</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A method to rank heat sinks in practice: the heat sink performance tester</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Lasance, C.J.M. ; Eggink, H.J.</creator><creatorcontrib>Lasance, C.J.M. ; Eggink, H.J.</creatorcontrib><description>One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application.</description><identifier>ISSN: 1065-2221</identifier><identifier>ISBN: 0780389859</identifier><identifier>ISBN: 9780780389854</identifier><identifier>EISSN: 2577-1000</identifier><identifier>DOI: 10.1109/STHERM.2005.1412170</identifier><language>eng</language><publisher>IEEE</publisher><subject>Computational fluid dynamics ; Costs ; Ducts ; Electronics cooling ; Heat sinks ; Heat transfer ; Joining processes ; Manufacturing ; Supercomputers ; Testing</subject><ispartof>Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005, 2005, p.141-145</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1412170$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1412170$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lasance, C.J.M.</creatorcontrib><creatorcontrib>Eggink, H.J.</creatorcontrib><title>A method to rank heat sinks in practice: the heat sink performance tester</title><title>Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005</title><addtitle>STHERM</addtitle><description>One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application.</description><subject>Computational fluid dynamics</subject><subject>Costs</subject><subject>Ducts</subject><subject>Electronics cooling</subject><subject>Heat sinks</subject><subject>Heat transfer</subject><subject>Joining processes</subject><subject>Manufacturing</subject><subject>Supercomputers</subject><subject>Testing</subject><issn>1065-2221</issn><issn>2577-1000</issn><isbn>0780389859</isbn><isbn>9780780389854</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFkMtOwzAURC0eEqH0C7rxDyRcv2KHXVWVtlIREmRfufaNYkrSyPaGv6cSlVjNYs6cxRCyYFAxBs3zZ7tdf7xVHEBVTDLONNyQgiutSwYAt-QRtAFhGqOaO1IwqFXJOWcPZJ7S14UAqYQBXpDdkg6Y-7On-UyjHU-0R5tpCuMp0TDSKVqXg8MXmnv87-iEsTvHwY4OacaUMT6R-85-J5xfc0ba13W72pb7981utdyXgWmVS2WtZ0Y3_Cidc9zXnnGwznstG8Sj4Q4cSt10AoSXl4mSUlinndCqBilmZPGnDYh4mGIYbPw5XE8Qv_k1TkE</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Lasance, C.J.M.</creator><creator>Eggink, H.J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2005</creationdate><title>A method to rank heat sinks in practice: the heat sink performance tester</title><author>Lasance, C.J.M. ; Eggink, H.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-5aad18792b4ccc2d6d120acdd749eeb82c0ce479f303d41755443ac7c3756043</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Computational fluid dynamics</topic><topic>Costs</topic><topic>Ducts</topic><topic>Electronics cooling</topic><topic>Heat sinks</topic><topic>Heat transfer</topic><topic>Joining processes</topic><topic>Manufacturing</topic><topic>Supercomputers</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Lasance, C.J.M.</creatorcontrib><creatorcontrib>Eggink, H.J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore (Online service)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lasance, C.J.M.</au><au>Eggink, H.J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A method to rank heat sinks in practice: the heat sink performance tester</atitle><btitle>Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005</btitle><stitle>STHERM</stitle><date>2005</date><risdate>2005</risdate><spage>141</spage><epage>145</epage><pages>141-145</pages><issn>1065-2221</issn><eissn>2577-1000</eissn><isbn>0780389859</isbn><isbn>9780780389854</isbn><abstract>One way of cooling electronic devices is through enlarging the surface that is in contact with a fluid (usually air) by attaching a heat sink. Since literally thousands of heat sinks are available many designers are confronted with the question: which one? Very often the designer's choice is based on cost and manufacturer's data. Unfortunately, this data cannot be used with confidence because they are almost exclusively based on measurements in a closed duct, thereby disregarding bypass effects and inflow conditions. CFD modeling is no option unless time, a supercomputer and a calibration laboratory are available. This paper discusses a method to rank heat sinks given a certain application. The measurement is based on the extraction of the average heat transfer coefficient from time-dependent temperature curves as a function of velocity and bypass. Scaling the measured effective heat transfer coefficient by mass, volume, weight or height provides several performance metrics allowing designers a novel way of ranking heat sinks in conditions that resemble the application.</abstract><pub>IEEE</pub><doi>10.1109/STHERM.2005.1412170</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1065-2221 |
ispartof | Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005, 2005, p.141-145 |
issn | 1065-2221 2577-1000 |
language | eng |
recordid | cdi_ieee_primary_1412170 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Computational fluid dynamics Costs Ducts Electronics cooling Heat sinks Heat transfer Joining processes Manufacturing Supercomputers Testing |
title | A method to rank heat sinks in practice: the heat sink performance tester |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T21%3A31%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20method%20to%20rank%20heat%20sinks%20in%20practice:%20the%20heat%20sink%20performance%20tester&rft.btitle=Semiconductor%20Thermal%20Measurement%20and%20Management%20IEEE%20Twenty%20First%20Annual%20IEEE%20Symposium,%202005&rft.au=Lasance,%20C.J.M.&rft.date=2005&rft.spage=141&rft.epage=145&rft.pages=141-145&rft.issn=1065-2221&rft.eissn=2577-1000&rft.isbn=0780389859&rft.isbn_list=9780780389854&rft_id=info:doi/10.1109/STHERM.2005.1412170&rft_dat=%3Cieee_6IE%3E1412170%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-5aad18792b4ccc2d6d120acdd749eeb82c0ce479f303d41755443ac7c3756043%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1412170&rfr_iscdi=true |