Ultrasonically stimulated modification of electrical characteristics of Hg/sub 1-x/Cd/sub x/Te epilayers

The degradation of electrophysical characteristics of Hg/sub 1-x/Cd/sub x/Te thin films grown by LPE and MBE as a consequence of the high-frequency and high-intensity elastic deformation effect was investigated. It was determined that parameters of Hg/sub 1-x/Cd/sub x/Te thin films grown by MBE are...

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Bibliographic Details
Main Authors: Sizov, F.F., Savkina, R.K., Smirnov, A.B.
Format: Conference Proceeding
Language:English
Subjects:
Conductivity
Degradation
Electric variables
Magnetic analysis
Magnetic fields
Magnetic films
Mercury (metals)
Molecular beam epitaxial growth
Tellurium
Transistors
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Summary:The degradation of electrophysical characteristics of Hg/sub 1-x/Cd/sub x/Te thin films grown by LPE and MBE as a consequence of the high-frequency and high-intensity elastic deformation effect was investigated. It was determined that parameters of Hg/sub 1-x/Cd/sub x/Te thin films grown by MBE are stable to ultrasonic influence whereas for Hg/sub 1-x/Cd/sub x/Te thin films grown by LPE the mobility decrease and the change of the conductivity type at low magnetic field were observed. The best agreement between experiment and calculation was obtained in the frame of assumption about forming of the thin layer with opposite conductivity. The possible mechanism of the observing effects was analyzed.
DOI:10.1109/ICIMW.2004.1422125