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A study of fault tolerant architectures for electronic in- and egress interconnections in optical burst/packet switched networks

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Bibliographic Details
Main Authors: Andreassen, R.O., Helvik, B.E., Sudbo, A.S., Zouganeli, E.
Format: Conference Proceeding
Language:English
Subjects:
Online Access:Request full text
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DOI:10.1109/ONDM.2005.1427033