Identification of radiation-induced parasitic leakage paths using light emission microscopy

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Bibliographic Details
Main Authors: Shaneyfelt, M.R., Tangyunyong, P., Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.
Format: Conference Proceeding
Language:English
Subjects:
CMOS technology
Degradation
Integrated circuit technology
Integrated circuit testing
Leakage current
Manufacturing processes
Microscopy
Process design
Radiation hardening
Transistors
Online Access:Request full text
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ISSN:0379-6566