Transition tests for high performance microprocessors

The scope and need for scan based transition tests in the context of high volume manufacturing testing of microprocessors is discussed. A classification of transition faults for latch based design is presented. Finally, we discuss a silicon experiment to understand the most fundamental issue of scan...

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Bibliographic Details
Main Authors: Yi-Shing Chang, Chakravarty, S., Hiep Hoang, Thorpe, N., Khen Wee
Format: Conference Proceeding
Language:English
Subjects:
Automatic test pattern generation
Cost function
Flip-flops
Manufacturing
Microprocessors
Robustness
Semiconductor device modeling
Silicon
Test pattern generators
Testing
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Description
Summary:The scope and need for scan based transition tests in the context of high volume manufacturing testing of microprocessors is discussed. A classification of transition faults for latch based design is presented. Finally, we discuss a silicon experiment to understand the most fundamental issue of scan based transition testing viz. their robustness.
ISSN:1093-0167
2375-1053
DOI:10.1109/VTS.2005.87