Hierarchical compactor design for diagnosis in deterministic logic BIST

Scan-based tests created by automatic test pattern generators (ATPG) can be efficiently compressed and applied in a deterministic built-in self-test (DBIST) architecture. However, the BIST environment adds significant complexity to failure diagnosis. We present a simple scan-compatible diagnosis sol...

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Bibliographic Details
Main Authors: Wohl, P., Waicukauski, J.A., Patel, S., Hay, C., Gizdarski, E., Mathew, B.
Format: Conference Proceeding
Language:English
Subjects:
Built-in self-test
Codecs
Computer architecture
Condition monitoring
Logic design
Logic testing
Performance evaluation
Pins
Silicon
Very large scale integration
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Summary:Scan-based tests created by automatic test pattern generators (ATPG) can be efficiently compressed and applied in a deterministic built-in self-test (DBIST) architecture. However, the BIST environment adds significant complexity to failure diagnosis. We present a simple scan-compatible diagnosis solution - streaming DBIST (SDBIST), which is based on a low-overhead hierarchical compactor SDBIST allows continuously monitoring streaming scanout data for reduced-volume expect-data diagnosis, on-line fail-data collection and selective scan cell masking.
ISSN:1093-0167
2375-1053
DOI:10.1109/VTS.2005.48