On the functional failure and switching time analysis of the MOBILE circuit [monostable-bistable logic element]

This paper discusses the failure mode and the switching time of a MOBILE (monostable-bistable logic element) circuit through analysis of circuit operation by representing the electrical characteristics of the RTD with a simplified piecewise linear model. The paper also verifies the analytical result...

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Bibliographic Details
Main Authors: Sing-Rong Li, Mazumder, P., Kyounghoon Yang
Format: Conference Proceeding
Language:English
Subjects:
Analytical models
Circuit analysis
Circuit simulation
Electric variables
Failure analysis
Logic circuits
Performance analysis
Physics
Piecewise linear techniques
Switching circuits
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Summary:This paper discusses the failure mode and the switching time of a MOBILE (monostable-bistable logic element) circuit through analysis of circuit operation by representing the electrical characteristics of the RTD with a simplified piecewise linear model. The paper also verifies the analytical results through circuit simulation performed with the University of Michigan Quantum Spice simulator. This augmented Spice incorporates the quantum physics based RTD model and appropriate convergence routines to overcome the non-monotonic nonlinearity of MOBILE circuits. The paper has also shown how to derive the optimal rising time of the clocked supply in a given MOBILE circuit. In order to guarantee the logic function of a MOBILE circuit, its device sizes must be made smaller than the critical values that primarily depend on the fabrication technology and the MOBILE circuit configuration.
ISSN:0271-4302
2158-1525
DOI:10.1109/ISCAS.2005.1465141