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Transistor noise at low temperatures
It is shown that the shot noise theory of transistors holds for low temperatures in alloy junction transistors, provided that the effect of hole-electron pair recombination in the emitter transition region is taken into account. The discrepancy between theory and experiment reported by Lee and Kamin...
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Published in: | IEEE transactions on electron devices 1964-02, Vol.11 (2), p.50-53 |
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Format: | Article |
Language: | English |
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container_end_page | 53 |
container_issue | 2 |
container_start_page | 50 |
container_title | IEEE transactions on electron devices |
container_volume | 11 |
creator | Bruncke, W.C. Chenette, E.R. van der Ziel, A. |
description | It is shown that the shot noise theory of transistors holds for low temperatures in alloy junction transistors, provided that the effect of hole-electron pair recombination in the emitter transition region is taken into account. The discrepancy between theory and experiment reported by Lee and Kaminsky can be accounted for by the fact that this process was ignored. |
doi_str_mv | 10.1109/T-ED.1964.15282 |
format | article |
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ispartof | IEEE transactions on electron devices, 1964-02, Vol.11 (2), p.50-53 |
issn | 0018-9383 1557-9646 |
language | eng |
recordid | cdi_ieee_primary_1473670 |
source | IEEE Electronic Library (IEL) Journals |
title | Transistor noise at low temperatures |
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