Loading…

IIB-7 electron bombarded silicon performance of CCD imagers

Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.

Saved in:
Bibliographic Details
Published in:IEEE transactions on electron devices 1975-11, Vol.22 (11), p.1059-1059
Main Authors: Roberts, C.G., Robinson, D.A., Barton, J.B., Collins, D.R.
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1975.18292