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V-4 topographical investigation of variations of stoichiometry in Ga1-xAlxAs and carrier concentrations in GaAs using electroreflectance
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Published in: | IEEE transactions on electron devices 1977-09, Vol.24 (9), p.1213-1213 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/T-ED.1977.18969 |