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V-4 topographical investigation of variations of stoichiometry in Ga1-xAlxAs and carrier concentrations in GaAs using electroreflectance

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Bibliographic Details
Published in:IEEE transactions on electron devices 1977-09, Vol.24 (9), p.1213-1213
Main Authors: Pollak, F.H., Okeke, C.E., Vanier, P.E., Raccah, P.M.
Format: Article
Language:English
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ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1977.18969