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KTC noise on direct injection from IR diodes

When a MOSFET is used to transfer the photogenerated charge from an IR diode to the input of a CCD in the "direct-injection" mode, Johnson-Nyquist noise on the MOSFET transconductance results in a variance in the charge integrated in the CCD which is approximately equal to KTC under the as...

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Bibliographic Details
Published in:IEEE transactions on electron devices 1980-05, Vol.27 (5), p.998-1000, Article 998
Main Authors: Buss, D.D., Kansy, R.J., Barton, J.B.
Format: Article
Language:English
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Summary:When a MOSFET is used to transfer the photogenerated charge from an IR diode to the input of a CCD in the "direct-injection" mode, Johnson-Nyquist noise on the MOSFET transconductance results in a variance in the charge integrated in the CCD which is approximately equal to KTC under the assumption of large diode resistance, where C is the detector capacitance.
ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1980.19973