Loading…

Nonlinear charge control in AlGaAs/GaAs modulation-doped FET's

A new model for nonlinear charge control in normally on modulation-doped field-effect transistors (MODFET's) is proposed. It is shown that conventional charge control models are insufficient to describe MODFET's with large negative pinchoff voltages, and that the depletion approximation is...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on electron devices 1987-08, Vol.34 (8), p.1617-1625
Main Authors: Hughes, W.A., Snowden, C.M.
Format: Article
Language:English
Subjects:
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c282t-2ff89335ed31aec8e395d16e76f83e13992e83bdda44a9b886aae410a9d0f83c3
cites
container_end_page 1625
container_issue 8
container_start_page 1617
container_title IEEE transactions on electron devices
container_volume 34
creator Hughes, W.A.
Snowden, C.M.
description A new model for nonlinear charge control in normally on modulation-doped field-effect transistors (MODFET's) is proposed. It is shown that conventional charge control models are insufficient to describe MODFET's with large negative pinchoff voltages, and that the depletion approximation is inaccurate in circumstances where the layer dimensions become of the order of a Debye length. The new model is based upon a one-dimensional numerical solution of Poisson's equation and the drift-diffusion equation. It also takes into account the shift in the 2DEG position with gate bias, and parallel conduction in the doped AlGaAs layer. The effect of nonlinear charge control on MODFET transconductance is considered by combining the new model with a two-dimensional analytic representation of the MODFET.
doi_str_mv 10.1109/T-ED.1987.23129
format article
fullrecord <record><control><sourceid>proquest_ieee_</sourceid><recordid>TN_cdi_ieee_primary_1486840</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1486840</ieee_id><sourcerecordid>24561468</sourcerecordid><originalsourceid>FETCH-LOGICAL-c282t-2ff89335ed31aec8e395d16e76f83e13992e83bdda44a9b886aae410a9d0f83c3</originalsourceid><addsrcrecordid>eNqNkD1PwzAQhi0EEqUwM7BkQDCl9Vcce0Gq2vIhVbCU2bo6Fwhy42KnA_-elFawstzpTs_7Dg8hl4yOGKNmvMznsxEzuhxxwbg5IgNWFGVulFTHZEAp07kRWpySs5Q--lNJyQfk7jm0vmkRYubeIb5h5kLbxeCzps0m_gEmabwb2TpUWw9dE9q8Chussvv58jadk5MafMKLwx6S1_4_fcwXLw9P08kid1zzLud1rY0QBVaCATqNwhQVU1iqWgtkwhiOWqyqCqQEs9JaAaBkFExFe8KJIbnZ925i-Nxi6uy6SQ69hxbDNlkuC8Wk0v8BC6152YPjPehiSClibTexWUP8sozanVC7tPOZ3Qm1P0L7xPWhGpIDX0doXZN-Y2UvWinaY1d7rEHEv1KplZZUfANcrHzS</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24558827</pqid></control><display><type>article</type><title>Nonlinear charge control in AlGaAs/GaAs modulation-doped FET's</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Hughes, W.A. ; Snowden, C.M.</creator><creatorcontrib>Hughes, W.A. ; Snowden, C.M.</creatorcontrib><description>A new model for nonlinear charge control in normally on modulation-doped field-effect transistors (MODFET's) is proposed. It is shown that conventional charge control models are insufficient to describe MODFET's with large negative pinchoff voltages, and that the depletion approximation is inaccurate in circumstances where the layer dimensions become of the order of a Debye length. The new model is based upon a one-dimensional numerical solution of Poisson's equation and the drift-diffusion equation. It also takes into account the shift in the 2DEG position with gate bias, and parallel conduction in the doped AlGaAs layer. The effect of nonlinear charge control on MODFET transconductance is considered by combining the new model with a two-dimensional analytic representation of the MODFET.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/T-ED.1987.23129</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Testing, measurement, noise and reliability</subject><ispartof>IEEE transactions on electron devices, 1987-08, Vol.34 (8), p.1617-1625</ispartof><rights>1988 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c282t-2ff89335ed31aec8e395d16e76f83e13992e83bdda44a9b886aae410a9d0f83c3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1486840$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,54771</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=7646660$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Hughes, W.A.</creatorcontrib><creatorcontrib>Snowden, C.M.</creatorcontrib><title>Nonlinear charge control in AlGaAs/GaAs modulation-doped FET's</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>A new model for nonlinear charge control in normally on modulation-doped field-effect transistors (MODFET's) is proposed. It is shown that conventional charge control models are insufficient to describe MODFET's with large negative pinchoff voltages, and that the depletion approximation is inaccurate in circumstances where the layer dimensions become of the order of a Debye length. The new model is based upon a one-dimensional numerical solution of Poisson's equation and the drift-diffusion equation. It also takes into account the shift in the 2DEG position with gate bias, and parallel conduction in the doped AlGaAs layer. The effect of nonlinear charge control on MODFET transconductance is considered by combining the new model with a two-dimensional analytic representation of the MODFET.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Testing, measurement, noise and reliability</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNqNkD1PwzAQhi0EEqUwM7BkQDCl9Vcce0Gq2vIhVbCU2bo6Fwhy42KnA_-elFawstzpTs_7Dg8hl4yOGKNmvMznsxEzuhxxwbg5IgNWFGVulFTHZEAp07kRWpySs5Q--lNJyQfk7jm0vmkRYubeIb5h5kLbxeCzps0m_gEmabwb2TpUWw9dE9q8Chussvv58jadk5MafMKLwx6S1_4_fcwXLw9P08kid1zzLud1rY0QBVaCATqNwhQVU1iqWgtkwhiOWqyqCqQEs9JaAaBkFExFe8KJIbnZ925i-Nxi6uy6SQ69hxbDNlkuC8Wk0v8BC6152YPjPehiSClibTexWUP8sozanVC7tPOZ3Qm1P0L7xPWhGpIDX0doXZN-Y2UvWinaY1d7rEHEv1KplZZUfANcrHzS</recordid><startdate>19870801</startdate><enddate>19870801</enddate><creator>Hughes, W.A.</creator><creator>Snowden, C.M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope></search><sort><creationdate>19870801</creationdate><title>Nonlinear charge control in AlGaAs/GaAs modulation-doped FET's</title><author>Hughes, W.A. ; Snowden, C.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c282t-2ff89335ed31aec8e395d16e76f83e13992e83bdda44a9b886aae410a9d0f83c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Testing, measurement, noise and reliability</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hughes, W.A.</creatorcontrib><creatorcontrib>Snowden, C.M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hughes, W.A.</au><au>Snowden, C.M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nonlinear charge control in AlGaAs/GaAs modulation-doped FET's</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>1987-08-01</date><risdate>1987</risdate><volume>34</volume><issue>8</issue><spage>1617</spage><epage>1625</epage><pages>1617-1625</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>A new model for nonlinear charge control in normally on modulation-doped field-effect transistors (MODFET's) is proposed. It is shown that conventional charge control models are insufficient to describe MODFET's with large negative pinchoff voltages, and that the depletion approximation is inaccurate in circumstances where the layer dimensions become of the order of a Debye length. The new model is based upon a one-dimensional numerical solution of Poisson's equation and the drift-diffusion equation. It also takes into account the shift in the 2DEG position with gate bias, and parallel conduction in the doped AlGaAs layer. The effect of nonlinear charge control on MODFET transconductance is considered by combining the new model with a two-dimensional analytic representation of the MODFET.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/T-ED.1987.23129</doi><tpages>9</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0018-9383
ispartof IEEE transactions on electron devices, 1987-08, Vol.34 (8), p.1617-1625
issn 0018-9383
1557-9646
language eng
recordid cdi_ieee_primary_1486840
source IEEE Electronic Library (IEL) Journals
subjects Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
title Nonlinear charge control in AlGaAs/GaAs modulation-doped FET's
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T15%3A47%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nonlinear%20charge%20control%20in%20AlGaAs/GaAs%20modulation-doped%20FET's&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Hughes,%20W.A.&rft.date=1987-08-01&rft.volume=34&rft.issue=8&rft.spage=1617&rft.epage=1625&rft.pages=1617-1625&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/T-ED.1987.23129&rft_dat=%3Cproquest_ieee_%3E24561468%3C/proquest_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c282t-2ff89335ed31aec8e395d16e76f83e13992e83bdda44a9b886aae410a9d0f83c3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=24558827&rft_id=info:pmid/&rft_ieee_id=1486840&rfr_iscdi=true