SPICE modeling of MOSFETs in deep submicron

As the mainstream MOS technology is scaling into nanometer sizes, the development of physical and predictive models for circuit simulation that cover geometry, bias, temperature, DC, AC, RF, and noise characteristics becomes a major goal. The paper addresses the scaling, trends and their limiting fa...

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Bibliographic Details
Main Authors: Angelov, G., Hristov, M.
Format: Conference Proceeding
Language:English
Subjects:
Circuit noise
Circuit simulation
Geometry
Mathematical model
MOSFETs
Physics
Predictive models
Radio frequency
SPICE
Temperature
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Summary:As the mainstream MOS technology is scaling into nanometer sizes, the development of physical and predictive models for circuit simulation that cover geometry, bias, temperature, DC, AC, RF, and noise characteristics becomes a major goal. The paper addresses the scaling, trends and their limiting factors and follows through the evolution of the three MOSFET model generations of SPICE: from the Berkeley Levels 1, 2, 3 to the latest BSIM3v3, BSIM4, MM11, EKV, and SP2001. MOSFET models are examined, emphasizing device physics and mathematical techniques for numerical calculation.
DOI:10.1109/ISSE.2004.1490430