The influence of technological process on properties and reliability of thick film layers

Thick film layers, and their properties, are the topic of this paper. Attention is paid to thick film resistors and particularly their behavior in connection with the trimming process. The influence of two methods of trimming was investigated and compared. Some samples were trimmed by a milling cutt...

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Main Authors: Pelikanova, I.B., Konupka, T.
Format: Conference Proceeding
Language:English
Subjects:
Capacitance-voltage characteristics
Drilling machines
Electric resistance
Electrical resistance measurement
Laser beam cutting
Linearity
Milling
Resistors
Thick films
Voltage
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creator Pelikanova, I.B.
Konupka, T.
description Thick film layers, and their properties, are the topic of this paper. Attention is paid to thick film resistors and particularly their behavior in connection with the trimming process. The influence of two methods of trimming was investigated and compared. Some samples were trimmed by a milling cutter and other samples were trimmed by laser. The change of resistance and non linearity of C-V characteristics were measured.
doi_str_mv 10.1109/ISSE.2004.1490444
format conference_proceeding
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ispartof 27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004, 2004, Vol.2, p.322-324 vol.2
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Capacitance-voltage characteristics
Drilling machines
Electric resistance
Electrical resistance measurement
Laser beam cutting
Linearity
Milling
Resistors
Thick films
Voltage
title The influence of technological process on properties and reliability of thick film layers
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