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Influence of interconnection surface finishes on quality of adhesive joints
Electrically conductive adhesives electrically connect and mechanically bond circuits to a variety of substrates. Four different silver-filled isotropically conductive adhesives have been used for attaching of 1206 chip components (resistors with "zero" values -jumpers) on printed-circuit...
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creator | Mach, P. Busek, D. Duraj, A. |
description | Electrically conductive adhesives electrically connect and mechanically bond circuits to a variety of substrates. Four different silver-filled isotropically conductive adhesives have been used for attaching of 1206 chip components (resistors with "zero" values -jumpers) on printed-circuit boards with six different interconnection surface finishes: Cu (standard cleaning), oxidized Cu, Cu after degradation vapors of H 2 SO 3 , Ni, Au over Ni, Sn (HAL). The resistances, nonlinearity, and noise of joints have been investigated before and after application of the dynamic mechanical load, which has been realized by periodical deflection of the printed circuit boards with assembled resistive chips. The load of the individual joints has been calculated. It has been found that degradation of Cu surface does not cause significant changes of electrical properties of the joints. The worst electrical parameters as well as the lowest resistance against the dynamic mechanical load have been found for the joints realized on Ni and Sn surface finishes |
doi_str_mv | 10.1109/ISSE.2005.1491050 |
format | conference_proceeding |
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Four different silver-filled isotropically conductive adhesives have been used for attaching of 1206 chip components (resistors with "zero" values -jumpers) on printed-circuit boards with six different interconnection surface finishes: Cu (standard cleaning), oxidized Cu, Cu after degradation vapors of H 2 SO 3 , Ni, Au over Ni, Sn (HAL). The resistances, nonlinearity, and noise of joints have been investigated before and after application of the dynamic mechanical load, which has been realized by periodical deflection of the printed circuit boards with assembled resistive chips. The load of the individual joints has been calculated. It has been found that degradation of Cu surface does not cause significant changes of electrical properties of the joints. The worst electrical parameters as well as the lowest resistance against the dynamic mechanical load have been found for the joints realized on Ni and Sn surface finishes</description><identifier>ISSN: 2161-2528</identifier><identifier>ISBN: 0780393252</identifier><identifier>ISBN: 9780780393257</identifier><identifier>DOI: 10.1109/ISSE.2005.1491050</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bonding ; Cleaning ; Conductive adhesives ; Degradation ; Integrated circuit interconnections ; Joining processes ; Resistors ; Surface finishing ; Surface resistance ; Tin</subject><ispartof>28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005, 2005, p.331-335</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1491050$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1491050$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Mach, P.</creatorcontrib><creatorcontrib>Busek, D.</creatorcontrib><creatorcontrib>Duraj, A.</creatorcontrib><title>Influence of interconnection surface finishes on quality of adhesive joints</title><title>28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005</title><addtitle>ISSE</addtitle><description>Electrically conductive adhesives electrically connect and mechanically bond circuits to a variety of substrates. Four different silver-filled isotropically conductive adhesives have been used for attaching of 1206 chip components (resistors with "zero" values -jumpers) on printed-circuit boards with six different interconnection surface finishes: Cu (standard cleaning), oxidized Cu, Cu after degradation vapors of H 2 SO 3 , Ni, Au over Ni, Sn (HAL). The resistances, nonlinearity, and noise of joints have been investigated before and after application of the dynamic mechanical load, which has been realized by periodical deflection of the printed circuit boards with assembled resistive chips. The load of the individual joints has been calculated. It has been found that degradation of Cu surface does not cause significant changes of electrical properties of the joints. The worst electrical parameters as well as the lowest resistance against the dynamic mechanical load have been found for the joints realized on Ni and Sn surface finishes</description><subject>Bonding</subject><subject>Cleaning</subject><subject>Conductive adhesives</subject><subject>Degradation</subject><subject>Integrated circuit interconnections</subject><subject>Joining processes</subject><subject>Resistors</subject><subject>Surface finishing</subject><subject>Surface resistance</subject><subject>Tin</subject><issn>2161-2528</issn><isbn>0780393252</isbn><isbn>9780780393257</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotT8tKw0AUHVDBtvoB4iY_kHjv3LxmKaXaYMFFdV0mM3dwSpxoJhH690bs6hzOC44QdwgZIqiHZr_fZBKgyDBXCAVciCVUNZAiWchLsZBYYjrT-losYzzOSSKJC_HSBNdNHAwnvUt8GHkwfQhsRt-HJE6D07PlfPDxg2Mya9-T7vx4-otrO2v-h5NjPzfjjbhyuot8e8aVeH_avK236e71uVk_7lKPRJCioVbWiq2F2uTKOsk2J6UAtVRtLqmtLCjIywLZUKlag66QlSFqc1s5Qytx_7_rmfnwNfhPPZwO5-P0C0wTTTI</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Mach, P.</creator><creator>Busek, D.</creator><creator>Duraj, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2005</creationdate><title>Influence of interconnection surface finishes on quality of adhesive joints</title><author>Mach, P. ; Busek, D. ; Duraj, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i1330-1c3b289edd08c49df2ed439901a29b423b7d0904651ec369bc1f527c33b4d7fc3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Bonding</topic><topic>Cleaning</topic><topic>Conductive adhesives</topic><topic>Degradation</topic><topic>Integrated circuit interconnections</topic><topic>Joining processes</topic><topic>Resistors</topic><topic>Surface finishing</topic><topic>Surface resistance</topic><topic>Tin</topic><toplevel>online_resources</toplevel><creatorcontrib>Mach, P.</creatorcontrib><creatorcontrib>Busek, D.</creatorcontrib><creatorcontrib>Duraj, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mach, P.</au><au>Busek, D.</au><au>Duraj, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Influence of interconnection surface finishes on quality of adhesive joints</atitle><btitle>28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005</btitle><stitle>ISSE</stitle><date>2005</date><risdate>2005</risdate><spage>331</spage><epage>335</epage><pages>331-335</pages><issn>2161-2528</issn><isbn>0780393252</isbn><isbn>9780780393257</isbn><abstract>Electrically conductive adhesives electrically connect and mechanically bond circuits to a variety of substrates. Four different silver-filled isotropically conductive adhesives have been used for attaching of 1206 chip components (resistors with "zero" values -jumpers) on printed-circuit boards with six different interconnection surface finishes: Cu (standard cleaning), oxidized Cu, Cu after degradation vapors of H 2 SO 3 , Ni, Au over Ni, Sn (HAL). The resistances, nonlinearity, and noise of joints have been investigated before and after application of the dynamic mechanical load, which has been realized by periodical deflection of the printed circuit boards with assembled resistive chips. The load of the individual joints has been calculated. It has been found that degradation of Cu surface does not cause significant changes of electrical properties of the joints. The worst electrical parameters as well as the lowest resistance against the dynamic mechanical load have been found for the joints realized on Ni and Sn surface finishes</abstract><pub>IEEE</pub><doi>10.1109/ISSE.2005.1491050</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
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identifier | ISSN: 2161-2528 |
ispartof | 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005, 2005, p.331-335 |
issn | 2161-2528 |
language | eng |
recordid | cdi_ieee_primary_1491050 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Bonding Cleaning Conductive adhesives Degradation Integrated circuit interconnections Joining processes Resistors Surface finishing Surface resistance Tin |
title | Influence of interconnection surface finishes on quality of adhesive joints |
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